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Cross-section specimen preparation device IB-10500HMS Cross-section Polisher™ High-throughput milling system-IB-19530CP+IB-10500HMS
Cross-section specimen preparation device IB-10500HMS Cross-section Polisher™ High-throughput milling system-Cosmo Trading Co., Ltd.

Cross-section specimen preparation device IB-10500HMS Cross-section Polisher™ High-throughput milling system
Cosmo Trading Co., Ltd.

Cosmo Trading Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

24.3hours

Relatively Fast Response


About This Product

■Achieving the world's fastest class ion milling speed

We have developed the ``IB-10500HMS high-throughput milling system,'' which uses a newly developed ion source in the cross-section sample preparation device cross-section polisher ``IB-19530CP, IB-19520CCP.'' By installing HMS, we achieved a cross-sectional milling rate of 1.2mm/h. (2.4 times compared to the previous model) Furthermore, by using a large rotating holder, flat milling with a width of 20 mm is now possible. Features: High-throughput processing

■Cross-sectional milling rate achieved by newly developed ion source.

1.2mm/h (2.4 times faster than conventional models) or more. The ion beam current density has been improved by optimizing the ion source electrode and increasing the acceleration voltage. The newly developed ion source has achieved a cross-sectional milling rate of 1.2 mm/h or more (2.4 times faster than conventional models). ・Sample: Silicon wafer ・Acceleration voltage: 10kV ・Processing time: 1 hour.

■ Cross-sectional milling (cooling) of low melting point alloys

Low melting point metals can melt due to processing heat, so they must be cooled before processing. By keeping the sample cool (this is a feature installed in the IB-19520CCP) and performing high-throughput processing, cross sections with reduced damage can be obtained in a short time. ・Acceleration voltage: 10kV ・Processing time: 30 minutes. Features: Wide-area flat milling

■Plane milling of concrete

・Acceleration voltage: 10kV ・Processing time: 20 minutes Concrete with a width of 20 mm was flat-milled over a wide area. After milling, polishing scratches and contamination are removed, and particles such as stone and cement contained in concrete can be clearly observed. Achieves flat milling over a wider area. It is now possible to irradiate a wide range of samples with the ion beam. Plane milling is effective for removing mechanical polishing scratches and crystal distortions that occur on the sample surface. (This is a function of IB-19530CP or IB-19520CCP equipped with the high-throughput specification option. Large sample rotating holder IB-11550LSRH is required.)

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    Cross-section specimen preparation device IB-10500HMS Cross-section Polisher™ High-throughput milling system

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2 Models of Cross-section specimen preparation device IB-10500HMS Cross-section Polisher™ High-throughput milling system

Click on the part number for more information about each product

Image Part Number Price (excluding tax) Power supply Intermittent machining mode Sample movement range Sample cooling retention time Sample cooling time to reach -100℃ Sample stage cooling temperature reached Sample swing function Automatic machining start mode Automatic cooling process start mode/automatic room temperature return mode Maximum power consumption Maximum loadable sample size Cross-section milling (width x length x thickness mm) Maximum loadable sample size Flat milling (mm) How to operate Ground terminal Wide cross-section milling mode Wide area plane milling mode Dimensions/mass (main body) (mm) Dimensions/mass (rotary pump) (mm) Room temperature/humidity External monitor output Camera magnification for processing observation Machining alignment method Cooling temperature setting range Camera magnification for positioning Finishing mode Milling speed Preset function Ion accelerating voltage Argon gas
Cross-section specimen preparation device IB-10500HMS Cross-section Polisher™ High-throughput milling system-Part Number-IB-19530CP+IB-10500HMS

IB-19530CP+IB-10500HMS

Available upon quote

Single phase AC100~120V, 50/60Hz, allowable input voltage fluctuation 10% or less, equipment rating 15A or more

Ion beam irradiation time and stop time can be set (ON: 1~999 seconds, OFF: 1~999 seconds)

X-axis: ±6mm, Y-axis: ±2.5mm

- - -

±30° automatic swing mode, arbitrary angle setting mode

-

650VA

11×10×2 (IB-19530CP standard accessory sample holder)
11×8×3 (IB-19520CCP standard accessory sample holder)
25×15×10 (Option: Wide area processing holder IB-11730LMH)

40 (diameter) x 15 (thickness) (option: large sample rotating holder IB-11550LSRH)

Touch panel, 6.5-inch display

Class D grounding (100Ω or less)

Maximum processing width: 8mm (option: wide area processing holder IB-11730LMH)

545 (width) x 550 (depth) x 420 (height), approximately 66 kg (IB-19530CP+IB-14510MCAM)
690 (width) x 720 (depth) x 530 (height), approximately 75 kg (IB-19520CCP)

120 (width) x 288.5 (depth) x 163 (height), approximately 9.3 kg

15~25℃/60% or less (no condensation)

You can switch between the alignment camera and processing observation camera and display them on an external monitor.
IB-19530CP+IB-14510MCAM and IB-19520CCP+EC-10020VST

Approximately ×20~×100 (on 6.5-inch display)
IB-19530CP+IB-14510MCAM and IB-19520CCP

Monitor the sample stage with a camera
Processing position can be adjusted even under an optical microscope

-

Approx. x 70 (on 6.5-inch display)

Automatically changes processing conditions

1.2mm/h or more (acceleration voltage 10kV)

4 presets of machining conditions (acceleration voltage, argon gas flow rate, machining time, intermittent machining)

2~10kV

Purity of 99.9999% or higher recommended
Working pressure: 0.1~0.2MPa (1.0~2.0kgf/cm2) Hose connection port: JIS B 0203 Rc 1/4

Cross-section specimen preparation device IB-10500HMS Cross-section Polisher™ High-throughput milling system-Part Number-IB-19520CCP+IB-10500HMS

IB-19520CCP+IB-10500HMS

Available upon quote

Single phase AC100~120V, 50/60Hz, allowable input voltage fluctuation 10% or less, equipment rating 15A or more

Ion beam irradiation time and stop time can be set (ON: 1~999 seconds, OFF: 1~999 seconds)

X-axis: ±6mm, Y-axis: ±2.5mm

8 hours or more

Within 60 minutes

-120℃ or less

±30° automatic swing mode, arbitrary angle setting mode

650VA

11×10×2 (IB-19530CP standard accessory sample holder)
11×8×3 (IB-19520CCP standard accessory sample holder)
25×15×10 (Option: Wide area processing holder IB-11730LMH)

40 (diameter) x 15 (thickness) (option: large sample rotating holder IB-11550LSRH)

Touch panel, 6.5-inch display

Class D grounding (100Ω or less)

Maximum processing width: 8mm (option: wide area processing holder IB-11730LMH)

545 (width) x 550 (depth) x 420 (height), approximately 66 kg (IB-19530CP+IB-14510MCAM)
690 (width) x 720 (depth) x 530 (height), approximately 75 kg (IB-19520CCP)

120 (width) x 288.5 (depth) x 163 (height), approximately 9.3 kg

15~25℃/60% or less (no condensation)

You can switch between the alignment camera and processing observation camera and display them on an external monitor.
IB-19530CP+IB-14510MCAM and IB-19520CCP+EC-10020VST

Approximately ×20~×100 (on 6.5-inch display)
IB-19530CP+IB-14510MCAM and IB-19520CCP

Monitor the sample stage with a camera
Processing position can be adjusted even under an optical microscope

-120~0℃

Approx. x 70 (on 6.5-inch display)

Automatically changes processing conditions

1.2mm/h or more (acceleration voltage 10kV)

4 presets of machining conditions (acceleration voltage, argon gas flow rate, machining time, intermittent machining)

2~10kV

Purity of 99.9999% or higher recommended
Working pressure: 0.1~0.2MPa (1.0~2.0kgf/cm2) Hose connection port: JIS B 0203 Rc 1/4

Click on the part number for more information about each product

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About Company Handling This Product

Response Rate

100.0%


Response Time

24.3hrs


Company Review

4.0
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