Focused ion beam processing and observation equipment JIB-PS500i FIB-SEM system-JIB-PS500i

Focused ion beam processing and observation equipment JIB-PS500i FIB-SEM system
Cosmo Trading Co., Ltd.

About This Product

■New sample preparation solutionJIB-PS500i provides three solutions to assist in TEM specimen preparation. From sample preparation to TEM observation, you can work with a reliable and high-throughput workflow.

■TEM-LINKAGEThe biaxially tilted cartridge and TEM holder make it easy to link TEM⇔FIB. The cartridge can be attached to the dedicated TEM sample holder with one touch.

■CHECK-AND-GOIn order to reliably prepare TEM samples, it is important to be able to check the prepared samples on the spot. With JIB-PS500i, you can seamlessly transition from TEM sample preparation to STEM observation. By repeating thin section processing and STEM observation, satisfactory specimens can be prepared.

■AUTOMATIC PREPARATIONAutomatic TEM sample preparation system STEMPLING2 automates TEM sample preparation. Since sample preparation is performed automatically, there is no variation in quality due to operator skill.

■Signal detection systemMultiple detectors are available, including standard equipment SED, UED, and iBED. By selecting the optimal detector according to the application, it is possible to effectively observe a variety of samples.

■High resolution SEM imagingEquipped with a newly developed superconical lens system in the SEM column, the observation performance at low accelerating voltages has been greatly improved. As a SEM for confirming the end point of thin section processing, it can obtain clear images with good contrast so that the end point of processing is not overlooked.

■SEM imaging of FIB-prepared cross sectionThe ultra-compact and thin retractable backscattered electron detector RBED can be used even when the stage is tilted. Optimal SEM observation can be performed not only for observing the sample surface, but also for observing FIB cross sections that require oblique observation, using a variety of detectors, including the secondary electron detector SED and upper detector UED.

■EDS integration softwareEDS analysis function has been incorporated into the main unit control software. Elemental analysis of samples can be performed without switching software. (This is possible only when equipped with JEOL EDS.)

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Focused ion beam processing and observation equipment JIB-PS500i FIB-SEM system

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Cosmo Trading Co., Ltd.

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1 Models of Focused ion beam processing and observation equipment JIB-PS500i FIB-SEM system

Image	Part Number	Price (excluding tax)	Sample stage Sample movement range	Sample stage method	Sample stage control	SEM electron gun	SEM Aperture Optimized Lens (ALC)	SEM long focal length (LDF) mode	SEM sample bias voltage	SEM standard detector	SEM objective lens	SEM incident voltage	SEM image resolution	SEM magnification	SEM beam current	FIB movable aperture	FIB acceleration voltage	FIB processing shape	FIB image resolution	FIB multiplier	FIB beam current	FIB ion source
	JIB-PS500i	Available upon quote	X: 130mm Y: 130mm Z: 1.0 mm ~40 mm T:-40.0~93.0° R: 360.0° endless	Full eucentric goniometer stage	Computer controlled 5 axis motor drive 3D interference detection AVERT Engine	In-lens shot key Plus field emission electron gun	Built-in	Built-in	0.0~-5.0kV	Secondary electron detector (SED), Upper electron detector (UED), In-lens backscattered electron detector (iBED)	Super conical lens	0.01~30kV	0.7nm (15kV) 1.4nm (1kV) 1.0 nm (1 kV, BD mode)	×50 ~ ×1,000,000 (STD mode) ×1,000 ~ ×1,000,000 (UHR mode) ×10 ~ ×19,000 (LDF mode)	Approximately 1 pA~500 nA or more	Motor drive 16 steps switching (3 stages are spare)	0.5~30kV	Rectangle, circle, polygon, point, line, bitmap shapes	3 nm (at 30 kV)	×50 ~ ×300,000 (Limited by acceleration voltage)	1.0 pA ~100 nA, 13-step switching (30 kV)	Ga liquid metal ion source

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Cosmo Trading Co., Ltd.

Japan

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Focused ion beam processing and observation equipment JIB-PS500i FIB-SEM system Cosmo Trading Co., Ltd.

About This Product

■New sample preparation solution

■TEM-LINKAGE

■CHECK-AND-GO

■AUTOMATIC PREPARATION

■Signal detection system

■High resolution SEM imaging

■SEM imaging of FIB-prepared cross section

■EDS integration software

1 Models of Focused ion beam processing and observation equipment JIB-PS500i FIB-SEM system

JIB-PS500i

Other products of Cosmo Trading Co., Ltd.

About Company Handling This Product

Focused ion beam processing and observation equipment JIB-PS500i FIB-SEM system
Cosmo Trading Co., Ltd.