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  4. Test socket test head for IC devices (Japan Connect Industry Co., Ltd.)
Test socket test head for IC devices-High frequency test head GURF series
Test socket test head for IC devices-Test head
Test socket test head for IC devices-Japan Connect Industry Co., Ltd.

Test socket test head for IC devices
Japan Connect Industry Co., Ltd.

Japan Connect Industry Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

62.6hours

Company Review

5.0

About This Product

The perfect instrument for measuring and verifying devices.

  • Product

    Test socket test head for IC devices

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2 Models of Test socket test head for IC devices

Click on the part number for more information about each product

Image Part Number Price (excluding tax) Compatible device Durability Frequency range RF insertion loss RF return loss
Test socket test head for IC devices-Part Number-High frequency test head GURF series

High frequency test head GURF series

Available upon quote

DBM, RF AMP, PLL, VCO, RF module, etc.

More than 5000 times

DC~18GHz

DC~10GHz 1.0dB

DC~10GHz 10.0dB

Test socket test head for IC devices-Part Number-Test head

Test head

Available upon quote - - - - -

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About Company Handling This Product

Japan Connect Industry Co., Ltd.

Response Rate

100.0%

Response Time

62.6hrs

Company Review

5.0
  • Japan

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Test Sockets
Test Sockets　Japan Connect Industry Co., Ltd.
Japan Connect Industry Co., Ltd.

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