Test socket test head for IC devices
Japan Connect Industry Co., Ltd.
About This Product
The perfect instrument for measuring and verifying devices.
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Product
Test socket test head for IC devices
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Handling Company
Japan Connect Industry Co., Ltd.
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Categories
2 Models of Test socket test head for IC devices
Items marked with have different values depending on the model number.
Click on the part number for more information about each product
| Product Image | Part Number | Price (excluding tax) | Compatible device | Durability | Frequency range | RF insertion loss | RF return loss |
|---|---|---|---|---|---|---|---|
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High frequency test head GURF series |
Available upon quote | DBM, RF AMP, PLL, VCO, RF module, etc. | More than 5000 times | DC~18GHz | DC~10GHz 1.0dB | DC~10GHz 10.0dB |
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Test head |
Available upon quote | - | - | - | - | - |
Click on the part number for more information about each product
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