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Test socket memory for IC devices-PS-BGAxxx-xxP-2936-SC
Test socket memory for IC devices-Gripper socket for DDR/GDDR
Test socket memory for IC devices-Gripper socket for LPDDR
Test socket memory for IC devices-Gripper socket for eMMC
Test socket memory for IC devices-Gripper socket for ONFiNAND
Test socket memory for IC devices-Japan Connect Industry Co., Ltd.

Test socket memory for IC devices
Japan Connect Industry Co., Ltd.

Japan Connect Industry Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

117.8hours


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    Test socket memory for IC devices

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5 Models of Test socket memory for IC devices

Click on the part number for more information about each product

Image Part Number Price (excluding tax) Compatible device type Durability Contact resistance Rated current Operating temperature range
Test socket memory for IC devices-Part Number-PS-BGAxxx-xxP-2936-SC

PS-BGAxxx-xxP-2936-SC

Available upon quote

BGA, LGA, QFN etc.

10,000 cycles min.

100mΩmax

0.5A

-55℃~+150℃

Test socket memory for IC devices-Part Number-Gripper socket for DDR/GDDR

Gripper socket for DDR/GDDR

Available upon quote - - - - -
Test socket memory for IC devices-Part Number-Gripper socket for LPDDR

Gripper socket for LPDDR

Available upon quote - - - - -
Test socket memory for IC devices-Part Number-Gripper socket for eMMC

Gripper socket for eMMC

Available upon quote - - - - -
Test socket memory for IC devices-Part Number-Gripper socket for ONFiNAND

Gripper socket for ONFiNAND

Available upon quote - - - - -

Click on the part number for more information about each product

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About Company Handling This Product

Response Rate

100.0%


Response Time

117.8hrs

  • Japan

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