Test socket memory for IC devices-PS-BGAxxx-xxP-2936-SC
Test socket memory for IC devices-Gripper socket for DDR/GDDR
Test socket memory for IC devices-Gripper socket for LPDDR
Test socket memory for IC devices-Gripper socket for eMMC
Test socket memory for IC devices-Gripper socket for ONFiNAND
Test socket memory for IC devices-Japan Connect Industry Co., Ltd.

Test socket memory for IC devices
Japan Connect Industry Co., Ltd.


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    Test socket memory for IC devices

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5 Models of Test socket memory for IC devices

Items marked with have different values depending on the model number.

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Product Image Part Number Price (excluding tax) Compatible device type Contact resistance Durability Operating temperature range Rated current
Test socket memory for IC devices-Part Number-PS-BGAxxx-xxP-2936-SC

PS-BGAxxx-xxP-2936-SC

Available upon quote BGA, LGA, QFN etc. 100mΩmax 10,000 cycles min. -55℃~+150℃ 0.5A
Test socket memory for IC devices-Part Number-Gripper socket for DDR/GDDR

Gripper socket for DDR/GDDR

Available upon quote - - - - -
Test socket memory for IC devices-Part Number-Gripper socket for LPDDR

Gripper socket for LPDDR

Available upon quote - - - - -
Test socket memory for IC devices-Part Number-Gripper socket for eMMC

Gripper socket for eMMC

Available upon quote - - - - -
Test socket memory for IC devices-Part Number-Gripper socket for ONFiNAND

Gripper socket for ONFiNAND

Available upon quote - - - - -

Click on the part number for more information about each product

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