Test socket for IC devices System level test-GU22 mold frame series
Test socket for IC devices System level test-GU41 series (1mm pitch)
Test socket for IC devices System level test-GUJ22 series
Test socket for IC devices System level test-GGJ20 series
Test socket for IC devices System level test-GGT18 series
Test socket for IC devices System level test-GGI series
Test socket for IC devices System level test-GRC series
Test socket for IC devices System level test-Japan Connect Industry Co., Ltd.

Test socket for IC devices System level test
Japan Connect Industry Co., Ltd.


About This Product

This is an IC socket used in the back-end process of semiconductor production. You can verify semiconductor devices and circuits using mass-production boards. Leave the custom design and manufacturing of test sockets to Nippon Connect Kogyo. We have a track record of developing numerous custom products, including special specifications. If you provide us with the following information, we will suggest the most suitable product. ■Information ・Dimensions of the device (including tolerance information and confirmation of lead shape) ・Restrictions such as the height of the device receiving surface ・Limitations on board area ・Shape compatible with sensor ・Durability ・Temperature (for burn-in test), humidity ・Used signal frequency, etc. *Other model numbers are available.

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    Test socket for IC devices System level test

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10 Models of Test socket for IC devices System level test

Items marked with have different values depending on the model number.

Click on the part number for more information about each product

Product Image Part Number Price (excluding tax) Capacitance Characteristic impedance Compatible device Contact resistance Durability Frequency Insertion force/per pin Mutual capacitance Mutual inductance Operating temperature range Pitch Probe pin type Rated current/per pin Self inductance
Test socket for IC devices System level test-Part Number-GU22 mold frame series

GU22 mold frame series

Available upon quote - - BGA (WLCSP), QFN, LGA - - - - - - - - - - -
Test socket for IC devices System level test-Part Number-GU22 series high heat resistant type

GU22 series high heat resistant type

Available upon quote - - BGA (WLCSP), QFN, LGA - - - - - - - - - - -
Test socket for IC devices System level test-Part Number-GU41 series (1mm pitch)

GU41 series (1mm pitch)

Available upon quote - - FTGB196, 256-Pin FBGA, FT256/FTG256, FG256/FGG256, FG320/FGG320, 324-Pin FBGA - - - - - - -40℃~+150℃ 1.0mm/0.039 - - -
Test socket for IC devices System level test-Part Number-GU41 series (0.8mm pitch)

GU41 series (0.8mm pitch)

Available upon quote - - 169-Pin, UBGACS144/CSG144, 256-Pin UBGA, CS324/CSG324, CS280/CSG280, SF363/SFG363, 484-Pin UBGA - - - - - - -40℃~+150℃ 0.8/0.031 - - -
Test socket for IC devices System level test-Part Number-GUJ22 series

GUJ22 series

Available upon quote - - - - - - - - - - - - - -
Test socket for IC devices System level test-Part Number-GGJ20 series

GGJ20 series

Available upon quote - - - - - - - - - - - - - -
Test socket for IC devices System level test-Part Number-GGT18 series

GGT18 series

Available upon quote - - BGA, LGA, QFN, QFP, etc. 100mΩmax - - - - - -35℃~+100℃ 0.3mm~ - - -
Test socket for IC devices System level test-Part Number-GGI series

GGI series

Available upon quote - - BGA, LGA, QFN, QFP, etc. - - - - - - - - - - -
Test socket for IC devices System level test-Part Number-GRC series

GRC series

Available upon quote 0.26pF (0.8mm pitch, measured value with SG9 parameters) 50Ω BGA, LGA, QFN etc. 100mΩmax - -1.0dB@60GHz (0.8mm pitch, measured value with SG9 parameters) - - - -55℃~+120℃ 0.8mm (0.5mm) ~ RF/POWER/GROUND - 0.81nH (0.8mm pitch, measured value with SG9 parameters)
Test socket for IC devices System level test-Part Number-Elastomer socket for FPGA

Elastomer socket for FPGA

Available upon quote - - - 30mΩ or less 2,000 cycles 27~32GHz 0.25N~0.35N 0.012pF~0.02pF 0.023nH~0.041nH -35℃~+100℃ - - 0.2A~2A 0.06nH~0.11nH

Click on the part number for more information about each product

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