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Double-sided semi-automatic prober HSP-150DS (6 inch)-HSP-150DS (6 inch)
Double-sided semi-automatic prober HSP-150DS (6 inch)-HiSOL,Inc.

Double-sided semi-automatic prober HSP-150DS (6 inch)
HiSOL,Inc.

HiSOL,Inc.'s Response Status

Response Rate

100.0%

Response Time

33.8hours

Relatively Fast Response


About This Product

We offer custom double-sided semi-automatic probe systems that allow access to both the front and back sides of the wafer. It can be used for evaluating various flip-chip type light receiving and emitting elements, failure analysis such as backside emission observation, double side probing, etc.

■Application

・On-wafer evaluation of optoelectronics (receiving and emitting elements), chip evaluation after dicing ・Backside emission observation (for failure analysis) ・Low ON resistance measurement of power devices (double side probing) ・Automatic probing of elements aligned on dicing tape ・Supports defective die marking (inker, scribe) ・Equipped with a laser cutter (point marking, protective film peeling, wiring cutting)

  • Product

    Double-sided semi-automatic prober HSP-150DS (6 inch)

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1 Models of Double-sided semi-automatic prober HSP-150DS (6 inch)

Image Part Number Price (excluding tax) Compatible wafer size Back side platen Z movement range Stage θ movement range Stage θ positioning resolution Stage Z repeat accuracy Stage Z movement range Stage XY repeat accuracy Stage XY movement range Stage XY positioning accuracy System weight System dimensions (W×D×H)
Double-sided semi-automatic prober HSP-150DS (6 inch)-Part Number-HSP-150DS (6 inch)

HSP-150DS (6 inch)

Available upon quote

~φ150mm

20mm (manual/automatic selection)

±5°

0.0002°

<±1um

20mm

<±2um

X: 160mm, Y: 250mm

<±5um

Approximately 750kg

1,600×1100×1,700mm

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About Company Handling This Product

Response Rate

100.0%


Response Time

33.8hrs

Company Overview

Hisol Inc., established in 1967 as Kan Electronics, is a manufacturer based in Tokyo, Japan, producing machine...

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  • Japan

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