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  4. Infrared laser scanning confocal microscope IRLC (Optoscience Co., Ltd.)
Infrared laser scanning confocal microscope IRLC-IRLC
Infrared laser scanning confocal microscope IRLC-Optoscience Co., Ltd.

Infrared laser scanning confocal microscope IRLC
Optoscience Co., Ltd.

Optoscience Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

14.1hours

Relatively Fast Response

About This Product

■For inspection of invisible subsurface defects

Invisible subsurface defects and manufacturing defects, such as microcracks and microvoids, are often overlooked. High doping during manufacturing makes non-destructive inspection/observation of wafers and chip packages very difficult. Standard wide-area inspection tools exist using near-infrared (NIR) or infrared (IR) light sources, but these systems do not provide deep penetration and require selective imaging at specific focal planes. That's all I can do. Features

■Near-infrared confocal microscope for inspecting the inside of silicon

The combination of a powerful near-infrared laser and a scanning confocal microscope provides several unique advantages over traditional wide-field IR microscopy systems. The first step is to create high-resolution images of thin subsurface sections or optical sections of transparent or translucent samples. This system configuration also leads to deeper target penetration, higher resolution, and faster image acquisition.

■Continuous dual observation with one click while keeping focus

The IRLC includes a color CMOS camera and an LED lighting system for brightfield imaging, allowing operators to quickly capture the area of ​​interest. The system for surface inspection is equipped with a near-infrared laser and a scanning confocal microscope. This combination allows deeper imaging up to 800 µm below the surface of the sample. You can switch between these observation methods with one click. The IRLC uses WDI's autofocus 6 sensor (ATF6), optical offset adjuster (OOA) and fast Z-axis actuator (ZAA) technology to remain in constant focus regardless of changes in observation method or surface measurement.

■Linear XY measurement and advanced image acquisition possible

The measurement tab within the software allows linear XY "point to point" and "point to multipoint" measurements. Measurements are recorded and saved in tabular format within the software and can also be exported as .csv for analysis. The system has advanced image acquisition options, including frame averaging, averaged images, maximum Z projection delta Z overlay, and single image sequence acquisition between two-point image sequential captures.

  • Product

    Infrared laser scanning confocal microscope IRLC

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1 Models of Infrared laser scanning confocal microscope IRLC

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Infrared laser scanning confocal microscope IRLC-Part Number-IRLC

IRLC

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About Company Handling This Product

Optoscience Co., Ltd.

Response Rate

100.0%

Response Time

14.1hrs

  • Japan

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