Automatic optical appearance inspection device Inspection Master SIM Series SIM 2000-SIM 2000

Automatic optical appearance inspection device Inspection Master SIM Series SIM 2000
Sanmei Co., Ltd.

Sanmei Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

87.6hours

Company Review

5.0

About This Product

SIM2000 is a standard optical observation type visual inspection device equipped with basic inspection functions. Defects as small as 1 μm can be detected and observed with a microscope image.

■Suitable for various workpiecesThe workpiece size can be up to 200 x 200mm, and both transparent and non-transparent workpieces are supported.

■Defect mapping functionDetected defects are mapped and a microscopic image can be observed by simply clicking on the location with the mouse.

■Equipped with a high-performance microscopeEquipped with differential interference observation and polarized light microscopy as standard. The objective lens can also be adjusted from 5x to 50x.

■High precision X-Y stageThe movable range is 200mm on each of the X and Y axes, and automatic positioning control is possible using a motor. The interchangeable work holder allows workpieces of various sizes to be handled.

■Detects defects of 1μm sizeThe visible light search function detects defects such as scratches, foreign objects, and particles down to 1μm in size.

■ Clear image observation possibleFor observation, clear images can be observed according to the state of the defect by switching between bright field/dark field, reflective/transmissive illumination, and selecting objective lens magnification.

■Easy to understand inspection softwareDisplays a list and map of defect data detected through image processing. It is also possible to categorize defects by size.

Model
There are 1 models for this product.

Product
Automatic optical appearance inspection device Inspection Master SIM Series SIM 2000

Handling Company
Sanmei Co., Ltd.

Categories

Testing Equipment

Visual Inspection Systems

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1 Models of Automatic optical appearance inspection device Inspection Master SIM Series SIM 2000

Image	Part Number	Price (excluding tax)	Microscope specifications	Power supply	Display	Housing	Image processing, inspection data	Lighting, filters etc.	Measurement function	Measurement target	Inspection time	Inspection method	Inspection software	Objective lens	Light source	Work size	Mapping function	Auto stage	Accessories
	SIM 2000	Available upon quote	Implemented normal mode and review mode During inspection, mode switching is performed automatically.	AC100V 20A	19 inch LCD display	Floor-mounted type, simple anti-vibration structure, Manual operation window that opens and closes vertically	64-bit CPU OS Windows7, built-in memory 10G HDD 2T bytes x 2	Brightfield/darkfield illumination switching. Differential interference and polarization filter switching function included as standard	Detection of scratches and foreign objects (particles, dust, dirt) on the workpiece surface	Compatible with both transparent and non-transparent glass and films Wafer (maximum 8 inch φ)	300 seconds/piece for 200mm x 200mm workpiece	Judgment function based on visual inspection and threshold setting by the operator (Foreign object size, quantity, etc.)	Automatic mapping software, image processing software and system control Defect data list display, map display, defect size can be classified into up to 5 categories, trend display	Normal mode: 5x, 10x Review mode: 5x, 10x, 20x, Magnification change: revolver rotation, automatic camera switching, polarization switching, differential switching	Reflective LED darkfield LED	Maximum 200mm×200mm Thickness within 2mm	Detected defect coordinates are managed and Move the objective lens directly to the target position possible to conduct observations	X stage stroke 200mm or more Y stage stroke 200mm or more Compatible with various sizes with various work holders	Vacuum pump (air negative pressure control 1 system)

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About Company Handling This Product

Sanmei Co., Ltd.

Response Rate

100.0%

Response Time

87.6hrs

Company Review

5.0

Japan

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Automatic optical appearance inspection device Inspection Master SIM Series SIM 2000 Sanmei Co., Ltd.

Sanmei Co., Ltd.'s Response Status

About This Product

■Suitable for various workpieces

■Defect mapping function

■Equipped with a high-performance microscope

■High precision X-Y stage

■Detects defects of 1μm size

■ Clear image observation possible

■Easy to understand inspection software

1 Models of Automatic optical appearance inspection device Inspection Master SIM Series SIM 2000

SIM 2000

Customers who viewed this product also viewed

Other products of Sanmei Co., Ltd.

About Company Handling This Product

Related search keywords

Automatic optical appearance inspection device Inspection Master SIM Series SIM 2000
Sanmei Co., Ltd.