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Beam analysis device-BSX-101
Beam analysis device-Opto Device Corporation Co., Ltd.

About This Product

The purpose of the Beam analysis device is to evaluate the optical performance of light condensing images such as optical pickups and objective lenses for optical pickups. This is a functional successor model of BSA-101 with improved measurement accuracy. It is possible to simultaneously monitor the high magnification, low magnification, and brightness distribution of the microscope optical system, and in addition to NFP characteristics, brightness distribution characteristics, electric stage, Defocus characteristics, skew characteristics, etc. are used for new image processing tailored to the new system. We have introduced a new measurement algorithm to the software. Beam analysis device function

■NFP measurement

We measure various NFP characteristics using a high-magnification microscope optical system.

■Intensity measurement

The incident light is made into parallel light and its intensity distribution is measured.

■Defocus measurement

Measure the Defocus characteristics of a focused Spot image using PZT.

■Camera Control

If you want to measure objects with different light intensity or change the light intensity, you can control the shutter speed of the camera and measure it.

■Skew measurement

The test object is tilted and the NFP characteristics at each tilt are automatically measured.

■Encircled Energy measurement

Measures the amount of light contained in a certain area or line.

■Others

Common to all models It is possible to change only the pseudo Disc (CoverGlass) without replacing the microscope objective lens, which has the greatest effect on aberrations in measurement results. ・Special objective lens for 405nm. - Parameters determined in the initial state, such as device calibration and reference position settings, are separated from the main software as SetUp software to prevent basic parameter changes due to erroneous operations. ・Performance evaluation using multiple types of CG with different disc standard thicknesses and refractive indexes is also possible.

■Shift measurement (Option compatible only for BSX-101 and 201)

Drive the actuator in the Track direction and Focus direction to perform NFP measurement and Intensity measurement. Therefore, Shift measurement does not capture changing phenomena, but rather confirms that they do not change.

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3 Models of Beam analysis device

Click on the part number for more information about each product

Image Part Number Price (excluding tax) High magnification detection unit field of view range High magnification detection unit Camera High magnification detection section (Spot measurement) Magnification Power supply Brightness distribution detection unit Field of view range Brightness distribution detection unit Camera Purpose Objective Lens magnification Objective Lens NA Dimensions W x D x H (mm) Optical Head fine movement stage Low magnification detection unit field of view range Low magnification detection section Magnification Low magnification detection unit Camera Revolver Soft Z automatic stage X-Y automatic stage TiltX-Y stage Piezoelectric element OS Cover Glass Unit Actuator drive control
Beam analysis device-Part Number-BSX-101

BSX-101

Available upon quote

2.2/magnification (mm) ×2.2/magnification (mm)

1/3inch PS CCD 480×480 (Pixel) 4.65μm square cell

Objective Lens magnification x 5x

AC100V

3.5/magnification (mm) ×3.5/magnification (mm)

1/3inch PS CCD 480×480 (Pixel) 7.4μm square cell

DVD,Blu-ray Pick-Up selection

DVD50x, Blu-ray100x

DVD 0.8, Blu-ray 0.95

600x600x800

3.5/magnification (mm) ×3.5/magnification (mm)

Objective Lens magnification x 0.25x

1/3inch PS CCD 480×480 (Pixel) 7.4μm square cell

BSX-101

Option

Windows XP

Option

Option

Beam analysis device-Part Number-BSX-201

BSX-201

Available upon quote

4.96/magnification (mm) ×4.96/magnification (mm)

1/3inch CCD 1024×768 (Pixel) 4.65μm square cell

Objective Lens magnification x 5x

AC100V

4.4/magnification (mm) ×3.3/magnification (mm)

1/3inch CCD 659×494 (Pixel) 7.4μm square cell

DVD,Blu-ray Pick-Up selection

90 times

0.95

600x600x800

4.4/magnification (mm) ×3.3/magnification (mm)

Objective Lens magnification x 0.25x

1/3inch CCD 659×494 (Pixel) 7.4μm square cell

BSX-201

Option

Windows XP

Option

Beam analysis device-Part Number-BSX-501

BSX-501

Available upon quote

1.66mm/magnification×1.66mm/magnification

2/3inch PS CCD 480×480 (Pixel) (Used area) 3.45μm square cell

500 times

AC100V

3.5/magnification (mm) ×3.5/magnification (mm)

1/3inch PS CCD 480×480 (Pixel) 7.4μm square cell

Blu-ray Pick-Up selection

100 times

0.95

600x600x800

3.5/magnification (mm) ×3.5/magnification (mm)

Objective Lens magnification x 0.25x

1/3inch PS CCD 480×480 (Pixel) 7.4μm square cell

BSX-501

Option

Windows XP

Option

Click on the part number for more information about each product

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