In-line interferometer
Opto Device Corporation Co., Ltd.
About This Product
In-Line interferometer is an interferometer system for evaluating wavefront aberration of parallel laser light. This system is especially suitable for evaluating and adjusting the wavefront aberration of parallel laser light after collimator output in the production line for optical PICKUP.
In-line interferometer function
■Measure wavefront aberration of light emitted from pickup, etc.
Main measurement items: P/V and RMS/POWER of wavefront aberration (focal deviation amount) / tertiary aberration (spherical aberration amount, COMA aberration amount and direction, and astigmatism amount and direction)
■Measure the light intensity balance of the light emitted from the pickup, etc.
Main measurement items: Calculation of the center of the luminous flux diameter, calculation of the center of luminance within the luminous flux/calculation of the RIM intensity ratio, display of the profile of the light intensity distribution/calculation of the Gaussian-fitting curve of the light intensity
■Measure the relative position and inclination of the light emitted from the pickup, etc. (relative to the reference object)
Main measurement item: Measure the inclination of the test beam entering the interferometer body
■Measure the transmitted wavefront aberration of a single optical component using a reference light source
Main measurement items: P/V and RMS/POWER of wavefront aberration (focal deviation amount) / tertiary aberration (spherical aberration amount, COMA aberration amount and direction, and astigmatism amount and direction)
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Product
In-line interferometer
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Handling Company
Opto Device Corporation Co., Ltd.
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Categories
2 Models of In-line interferometer
Items marked with have different values depending on the model number.
Click on the part number for more information about each product
| Product Image | Part Number | Price (excluding tax) | Alignment mode (for optical axis adjustment) | Analysis method | Autocollimator (for adjustment) | Beam analysis mode | CCD camera for capture | CCD camera for display and calculation | Computer | Incident power | Interference fringe analysis mode | Interference fringe analysis speed | Interference method | Interferometer body dimensions WxDxH (mm) | Measurement beam diameter | Measurement software | Measurement wavelength | Power supply | Static mode | W.D. | Weight | XY axis stage | Αβ axis gonio stage |
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RSI-101 |
Available upon quote | ○ | Fourier transform method | Option | ○ | 640×480 (pixel) | 320×240 (pixel) | Windows XP | 0.2m~2mW | ○ | Approximately 0.5 seconds (with 9 Zernike terms) | Radial shearing method | 260×300×80.5 | Φ4.5mm | SIF-C405 | 405nm | AC100~240V | ○ | 195mm | Approximately 50Kg | Option | Option |
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RSI-301 |
Available upon quote | ○ | Fourier transform method | Option | ○ | 640×480 (pixel) | 320×240 (pixel) | Windows XP | 0.2m~2mW | ○ | Approximately 0.5 seconds (with 9 Zernike terms) | Radial shearing method | 260×300×80.5 | Φ4.5mm | SIF-C660 | 660nm | AC100~240V | ○ | 195mm | Approximately 50Kg | Option | Option |
Click on the part number for more information about each product
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