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  2. Standard sample for calibration of atomic force microscope AFM Tip Characterizer (AFMTC) (Park Systems Japan Co., Ltd.)
Standard sample for calibration of atomic force microscope AFM Tip Characterizer (AFMTC)-AFM Tip Characterizer (AFMTC)
Standard sample for calibration of atomic force microscope AFM Tip Characterizer (AFMTC)-Park Systems Japan Co., Ltd.

Standard sample for calibration of atomic force microscope AFM Tip Characterizer (AFMTC)
Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

26.4hours

Relatively Fast Response

About This Product

The AFMTC sample consists of 10 ultrafine trenches (10-50 nm) and 50 nm separated lines. This calibration sample is provided to users as a certified reference material for nanoscale trench measurements and for characterizing AFM tip geometry.

  • Product

    Standard sample for calibration of atomic force microscope AFM Tip Characterizer (AFMTC)

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1 Models of Standard sample for calibration of atomic force microscope AFM Tip Characterizer (AFMTC)

Image Part Number Price (excluding tax) Material Line width Traceability Trench width Trench height
Standard sample for calibration of atomic force microscope AFM Tip Characterizer (AFMTC)-Part Number-AFM Tip Characterizer (AFMTC)

AFM Tip Characterizer (AFMTC)

Available upon quote

Polycrystalline silicon

50nm

KOLAS* (KRISS**) complies with ISO 17034:2016.

10nm, 13nm, 16nm, 19nm, 22nm, 26nm, 30nm, 35nm, 40nm, 50nm

100nm (not certified), 4.0mm (certified area: 3mm from center)

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About Company Handling This Product

Park Systems Japan Co., Ltd.

Response Rate

100.0%

Response Time

26.4hrs

  • Japan

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