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  4. Power device KGD (Semi Next Co., Ltd.)
Power device KGD-Power device KGD
Power device KGD-Semi Next Co., Ltd.

Power device KGD
Semi Next Co., Ltd.

About This Product

■Full test at low cost. The sealed structure of the probe ensures the safety and reliability of the press

Our "KGD" is an inspection device that performs 4-Site parallel tests and can perform static + dynamic tests at room temperature and high temperature. UPH is high, 1000-1200, test efficiency is high, and test costs are significantly reduced. Also compatible with various LD/ULD boxes. The probe's sealed structure ensures inspection safety and reliability. Features ・Compatible with various LD/ULD boxes ・Temperature range RT-200C (-45C optional) ・Compatible with 3,000V/1,200A ・Full test of 4Site parallel test and static + dynamic test is possible. ・Specially designed circuit ensures circuit inductance is less than 15nH

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    Power device KGD

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1 Models of Power device KGD

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Power device KGD-Part Number-Power device KGD

Power device KGD

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About Company Handling This Product

Semi Next Co., Ltd.

  • Japan

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Semiconductor Manufacturing Equipment Component & Part Machining
Semiconductor Manufacturing Equipment Component & Part Machining　Semi Next Co., Ltd.
Semi Next Co., Ltd.

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