Shielding Prober SP Series
Yuzan Co., Ltd.
About This Product
Supports 1/f noise and minute current measurements without being affected by the installation environment.
The unique compact shield structure provides an environment for measuring wafers at the same level as packaged devices. The low system noise floor level makes it possible to measure devices with very low output noise. A stable measurement environment can be achieved for measurements such as microcurrent measurement, microvoltage measurement, and Quasi-Static C-V measurement. The SP series can handle up to 300mm wafers.
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Product
Shielding Prober SP Series
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Handling Company
Yuzan Co., Ltd.
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Categories
1 Models of Shielding Prober SP Series
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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SP-8 |
Available upon quote |
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About Company Handling This Product
- Japan