3D white light interference microscope Contour X-100/200
Sanko Ematech Co., Ltd.
About This Product
■Features
・Standard model of interference microscope with excellent cost performance
・Various 3D measurements: surface shape (roughness), shape, level difference
・Overwhelming height measurement dynamic range: 0.1nm~19mm
・High measurement reproducibility achieved through closed-loop control
・Equipped with a measurement mode that matches the sample as standard
・Applicable to materials with different reflectance using two types of high-brightness LEDs
・Easy to operate by anyone with Japanese compatible software
・Manual or electric set available
- Necessary functions can be expanded from a wide range of options
■Optional parts
Turret Compatible Objective Lens (Contour Single Compatible Objective Lens (Contour 10XTTM, 20XTTM
■Equipment upgrade (Contour X-100/200)
A real color imaging system can be added. In addition to height information obtained through interferometric measurements, real color information is also acquired at the same time. The RealColor system exhibits excellent performance when measuring surfaces with different colors within the microscopic field of view.
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Product
3D white light interference microscope Contour X-100/200
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Handling Company
Sanko Ematech Co., Ltd.
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Categories
2 Models of 3D white light interference microscope Contour X-100/200
Items marked with have different values depending on the model number.
Click on the part number for more information about each product
| Product Image | Part Number | Price (excluding tax) | CCD camera type | Control analysis software Vision64 basic functions | Light source used | Manufacturer | Maximum measurement range | Maximum measurement speed | Measurement method | Overwhelming height measurement dynamic range | Step reproducibility | Tilt adjustment | Various 3D measurements | Vertical resolution | XY stage sample | Z sample space | Z stage |
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Contour X-100 |
Available upon quote | Standard monochrome 1,200 x 1,000 pixels, color (optional) | Automatic adjustment (light intensity, range), 2D analysis, 3D analysis, multi-region analysis, electric focus, [Option] Vision64Map (high-performance offline control analysis software) | High brightness LED (white.green) | Bruker Japan Co., Ltd. | Max 10mm | 37μm/sec | USI method, VSI method, PSI method | 0.1nm~19mm | <0.1% | ±6°manual | Surface shape (roughness), shape, step | <0.01mm | 150mm×150mm manual | 100mm | 100mm manual |
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Contour X-200 |
Available upon quote | Standard monochrome 1,200 x 1,000 pixels, color (optional) | Automatic adjustment (light intensity, range), 2D analysis, 3D analysis, multi-region analysis, electric focus, [Option] Vision64Map (high-performance offline control analysis software) | High brightness LED (white.green) | Bruker Japan Co., Ltd. | Max 10mm | 37μm/sec | USI method, VSI method, PSI method | 0.1nm~19mm | <0.1% | ±6°manual | Surface shape (roughness), shape, step | <0.01mm | 150mm×150mm electric | 100mm | 100mm electric |
Click on the part number for more information about each product
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About Company Handling This Product
- Japan