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3D white light interference microscope Contour X-100/200Handling Company
Sanko Ematech Co., Ltd.Categories
Click on the part number for more information about each product
| Image | Part Number | Price (excluding tax) | Measurement method | Step reproducibility | Maximum measurement speed | Maximum measurement range | Vertical resolution | Overwhelming height measurement dynamic range | Various 3D measurements | Control analysis software Vision64 basic functions | Tilt adjustment | Light source used | Manufacturer | Z stage | Z sample space | XY stage sample | CCD camera type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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Contour X-100 |
Available upon quote |
USI method, VSI method, PSI method |
<0.1% |
37μm/sec |
Max 10mm |
<0.01mm |
0.1nm~19mm |
Surface shape (roughness), shape, step |
Automatic adjustment (light intensity, range), 2D analysis, 3D analysis, multi-region analysis, electric focus, [Option] Vision64Map (high-performance offline control analysis software) |
±6°manual |
High brightness LED (white.green) |
Bruker Japan Co., Ltd. |
100mm manual |
100mm |
150mm×150mm manual |
Standard monochrome 1,200 x 1,000 pixels, color (optional) |
|
|
Contour X-200 |
Available upon quote |
USI method, VSI method, PSI method |
<0.1% |
37μm/sec |
Max 10mm |
<0.01mm |
0.1nm~19mm |
Surface shape (roughness), shape, step |
Automatic adjustment (light intensity, range), 2D analysis, 3D analysis, multi-region analysis, electric focus, [Option] Vision64Map (high-performance offline control analysis software) |
±6°manual |
High brightness LED (white.green) |
Bruker Japan Co., Ltd. |
100mm electric |
100mm |
150mm×150mm electric |
Standard monochrome 1,200 x 1,000 pixels, color (optional) |
Click on the part number for more information about each product
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