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3D white light interference microscope Contour X-500-Contour X-500
3D white light interference microscope Contour X-500-Sanko Ematech Co., Ltd.

3D white light interference microscope Contour X-500
Sanko Ematech Co., Ltd.

Sanko Ematech Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

42.2hours


About This Product

■Features

・High performance model equipped with electric head tilt ・High measurement reproducibility achieved through closed-loop control ・Equipped with a measurement mode that matches the sample as standard ・Applicable to materials with different reflectance using two types of high-brightness LEDs ・Easy to operate by anyone with Japanese compatible software ・Manual or electric set available - Necessary functions can be expanded from a wide range of options

■Optional parts

Tablet Compatible Objective Lens Standard objective lens: 2.5X, 5X, 10X, 20X, 50X, 115X, optical zoom lens: 0.55X, 0.75X, 1.5X, 2X. Single compatible objective lens Objective lens adapter, low magnification interference objective lens: 1.5X, long working interference objective lens: 2XLWD, 5XLWD, 10XLWD, environmental compatible lens (TTM type) lens: 2XTTM, 5XTTM, 10XTTM, 20XTTM

■Equipment upgrade

A real color imaging system can be added. In addition to height information obtained through interferometric measurements, real color information is also acquired at the same time. The RealColor system exhibits excellent performance when measuring surfaces with different colors within the microscopic field of view.

  • Product

    3D white light interference microscope Contour X-500

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1 Models of 3D white light interference microscope Contour X-500

Image Part Number Price (excluding tax) Measurement method Step reproducibility Maximum measurement speed Maximum measurement range Vertical resolution Overwhelming height measurement dynamic range Various 3D measurements Control analysis software Vision64 basic functions Tilt adjustment Light source used Manufacturer Z stage Z sample space XY stage sample CCD camera type
3D white light interference microscope Contour X-500-Part Number-Contour X-500

Contour X-500

Available upon quote

USI method, VSI method, PSI method

<0.1%

37μm/sec

Max 10mm

<0.01mm

0.1nm~19mm

Surface shape (roughness), shape, step

Automatic adjustment (light intensity, range), 2D analysis, 3D analysis, multi-region analysis, autofocus, stitching, stage program, Vision64Map (high-performance offline control analysis software)

±6° electric mation head (computer control)

High brightness LED (white.green)

Bruker Japan Co., Ltd.

100mm electric

Switching between 100mm and 150mm

150mm×150mm electric (encoder control)

Standard monochrome 1200 x 1000 pixels, color (optional)

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About Company Handling This Product

Response Rate

100.0%


Response Time

42.2hrs


Company Review

5.0
  • Japan

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