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3D white light interference microscope Contour X-500Handling Company
Sanko Ematech Co., Ltd.Categories
Image | Part Number | Price (excluding tax) | Measurement method | Step reproducibility | Maximum measurement speed | Maximum measurement range | Vertical resolution | Overwhelming height measurement dynamic range | Various 3D measurements | Control analysis software Vision64 basic functions | Tilt adjustment | Light source used | Manufacturer | Z stage | Z sample space | XY stage sample | CCD camera type |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Contour X-500 |
Available upon quote |
USI method, VSI method, PSI method |
<0.1% |
37μm/sec |
Max 10mm |
<0.01mm |
0.1nm~19mm |
Surface shape (roughness), shape, step |
Automatic adjustment (light intensity, range), 2D analysis, 3D analysis, multi-region analysis, autofocus, stitching, stage program, Vision64Map (high-performance offline control analysis software) |
±6° electric mation head (computer control) |
High brightness LED (white.green) |
Bruker Japan Co., Ltd. |
100mm electric |
Switching between 100mm and 150mm |
150mm×150mm electric (encoder control) |
Standard monochrome 1200 x 1000 pixels, color (optional) |
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Reviews shown here are reviews of companies.
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100.0%
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Company Review
5.0