3D white light interference microscope Contour X-500
Sanko Ematech Co., Ltd.
About This Product
■Features
・High performance model equipped with electric head tilt
・High measurement reproducibility achieved through closed-loop control
・Equipped with a measurement mode that matches the sample as standard
・Applicable to materials with different reflectance using two types of high-brightness LEDs
・Easy to operate by anyone with Japanese compatible software
・Manual or electric set available
- Necessary functions can be expanded from a wide range of options
■Optional parts
Tablet Compatible Objective Lens Standard objective lens: 2.5X, 5X, 10X, 20X, 50X, 115X, optical zoom lens: 0.55X, 0.75X, 1.5X, 2X. Single compatible objective lens Objective lens adapter, low magnification interference objective lens: 1.5X, long working interference objective lens: 2XLWD, 5XLWD, 10XLWD, environmental compatible lens (TTM type) lens: 2XTTM, 5XTTM, 10XTTM, 20XTTM
■Equipment upgrade
A real color imaging system can be added. In addition to height information obtained through interferometric measurements, real color information is also acquired at the same time. The RealColor system exhibits excellent performance when measuring surfaces with different colors within the microscopic field of view.
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Product
3D white light interference microscope Contour X-500
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Handling Company
Sanko Ematech Co., Ltd.
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Categories
1 Models of 3D white light interference microscope Contour X-500
| Product Image | Part Number | Price (excluding tax) | CCD camera type | Control analysis software Vision64 basic functions | Light source used | Manufacturer | Maximum measurement range | Maximum measurement speed | Measurement method | Overwhelming height measurement dynamic range | Step reproducibility | Tilt adjustment | Various 3D measurements | Vertical resolution | XY stage sample | Z sample space | Z stage |
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Contour X-500 |
Available upon quote | Standard monochrome 1200 x 1000 pixels, color (optional) | Automatic adjustment (light intensity, range), 2D analysis, 3D analysis, multi-region analysis, autofocus, stitching, stage program, Vision64Map (high-performance offline control analysis software) | High brightness LED (white.green) | Bruker Japan Co., Ltd. | Max 10mm | 37μm/sec | USI method, VSI method, PSI method | 0.1nm~19mm | <0.1% | ±6° electric mation head (computer control) | Surface shape (roughness), shape, step | <0.01mm | 150mm×150mm electric (encoder control) | Switching between 100mm and 150mm | 100mm electric |
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About Company Handling This Product
- Japan