Product
3D white light interference microscope Contour GT-XHandling Company
Sanko Ematech Co., Ltd.Categories
Product Image | Part Number | Price (excluding tax) | CCD camera type | Control/analysis software Vision64 basic functions | Light source used | Manufacturer | Maximum measurement range | Maximum measurement speed | Measurement method | Overwhelming height measurement dynamic range | Step reproducibility | Tilt adjustment | Various 3D measurements | Vertical resolution | XY stage sample | Z sample space | Z stage |
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Contour GT-X |
Available upon quote | Standard monochrome 1200 x 1000 pixels, color (optional) | Automatic adjustment (light intensity, range), 2D analysis, 3D analysis, multi-region analysis, autofocus, stitching, stage program, Vision64Map (high-performance offline control analysis software) | High brightness LED (white.green) | Bruker Japan Co., Ltd. | Max 10mm | 114μm/sec | USI method, VSI method, PSI method | 0.1nm~19mm | <0.1% | ±6° electric mation head (computer control) | Surface shape (roughness), shape, step | <0.01mm | 300mm×300mm electric (encoder control) | 80mm | 100mm electric |