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  4. White interference microscope PTIFiS IS-R100 (SINTOKOGIO, LTD.)
White interference microscope PTIFiS IS-R100-IS-R100
White interference microscope PTIFiS IS-R100-SINTOKOGIO, LTD.

White interference microscope PTIFiS IS-R100
SINTOKOGIO, LTD.

SINTOKOGIO, LTD.'s Response Status

Response Rate

100.0%

Response Time

35.4hours

About This Product

■Advantages and features of 3D shape measurement using white light interference

Since the resolution of height measurement does not depend on optical resolution, it is possible to measure height (steps) and roughness with a resolution of 1 nm over a wide measurement range.

■Profile window

Displays the cross-sectional profile along the line specified in the 2D display image. The profile window allows analysis of length/average height/maximum/minimum height, etc., and is also equipped with a tilt correction function (approximate straight line/2-point slope/curve/circle).

■Surface roughness analysis

This window is used to calculate and display surface roughness. Conforms to the new roughness standard JIS B0681-2. Accurate roughness analysis is performed using surface information that cannot be evaluated with contact measuring instruments.

■Line roughness analysis

This window is used to calculate and display line roughness. Compatible with roughness parameters compliant with JIS B0601:2001/2013.

■Description

Non-contact measurement using white light interferometry enables measurement of surface shape, height (steps), and roughness with both a wide field of view and high resolution. It has a wide range of analysis functions based on the acquired 3D data, and can be used for a wide range of purposes, from measurement to observation and analysis. In addition to conventional line roughness evaluation, we also support surface roughness measurement according to the latest JIS B0681-2. This white interference microscope is ideal for precision micromachining and surface roughness evaluation of smooth polished parts.

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    White interference microscope PTIFiS IS-R100

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1 Models of White interference microscope PTIFiS IS-R100

Image Part Number Price (excluding tax) Microscope Vibration isolation mechanism Field of view Illumination Step measurement repeatability Effective measurement range Maximum measurement object size Objective lens Vertical resolution XY stage
White interference microscope PTIFiS IS-R100-Part Number-IS-R100

IS-R100

Available upon quote

Single mount microscope

Passive vibration isolation table (option: active vibration isolation table)

H:7.00×V:5.00mm~ H:0.17×V:0.12mm

Coaxial epi-illumination (white LED)

Σ≦0.5%

X:75×Y:50mm Z1 axis (focusing unit):30mm
Z2 axis (microscope height adjustable stroke): 90mm
Z3 axis (piezo drive): 250μm (option: 400μm)

W:201×D:104×H:120mm
(H: 116mm when objective lens is 5x, 85mm when objective lens is 2.5x)

Choose from the following six.
2.5×, 5×, 10×, 20×, 50×, 100×

Vertical scanning method: 1nm/Phase shift method: 0.1nm

Manual

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About Company Handling This Product

SINTOKOGIO, LTD.

Response Rate

100.0%

Response Time

35.4hrs

Company Overview

Sintokogio, Ltd., headquartered in Nagoya City, Japan, and established in 1934, is a versatile manufacturer of...

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  • Japan

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