All Categories

History

  1. Metoree
  2. General purpose stylus profiling system Dektak XT (Bruker Corporation)
General purpose stylus profiling system Dektak XT-Dektak XT
General purpose stylus profiling system Dektak XT-Bruker Corporation

General purpose stylus profiling system Dektak XT
Bruker Corporation

About This Product

Dektak XT Stylus Profiler – 10th generation stylus profiling system

■Step up to ultimate measurement performance

Bruker's stylus profiler "DektakXT" is characterized by an innovative design that enables step measurement repeatability of less than 4 Å. This major advance is the result of Dektak's more than 50 years of innovation and industrial leadership. Combining Dektak's 50 years of world-leading technology, DektakXT delivers the ultimate in measurement performance, ease of use, and great value for measurement control in process development from R&D to QC. Provide. Incorporating 10 generations of scientific and technological breakthroughs, DektakXT enables nanometer-level surface profile measurements critical to microelectronics, semiconductors, solar panels, high-brightness LEDs, medical technology, and organic materials science. I'll make it. Stylus profiling system (6inch XY & Θ)

  • Product

    General purpose stylus profiling system Dektak XT

Share this product


150+ people viewing

Last viewed: 4 hours ago

Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

1 Models of General purpose stylus profiling system Dektak XT

Image Part Number Price (excluding tax)
General purpose stylus profiling system Dektak XT-Part Number-Dektak XT

Dektak XT

Available upon quote

Other products of Bruker Corporation

Reviews shown here are reviews of companies.

Atomic force microscope (material AFM) large platform Dimension series-Bruker Corporation

Atomic force microscope (material AFM) large platform Dimension series

Bruker Corporation

620+ people viewing

Last viewed: 3 hours ago

Response time: 24.53 hours

Coordinate Measuring Machines

32 models listed

Atomic force microscope (material AFM) small platform-Bruker Corporation

Atomic force microscope (material AFM) small platform

Bruker Corporation

470+ people viewing

Last viewed: 3 hours ago

Response time: 24.53 hours

Scanning Probe Microscopes

9 models listed

Atomic force microscope (material AFM) options-Bruker Corporation

Atomic force microscope (material AFM) options

Bruker Corporation

320+ people viewing

Last viewed: 13 hours ago

Response time: 24.53 hours

2 models listed

Bio AFM (Atomic Force Microscope) Automated Force Spectroscopy-Bruker Corporation

Bio AFM (Atomic Force Microscope) Automated Force Spectroscopy

Bruker Corporation

500+ people viewing

Last viewed: 3 hours ago

Response time: 24.53 hours

Atomic Force Microscopes

14 models listed

Bio AFM (atomic force microscope) optical tweezers-Bruker Corporation

Bio AFM (atomic force microscope) optical tweezers

Bruker Corporation

400+ people viewing

Last viewed: 3 hours ago

Response time: 24.53 hours

Scanning Probe Microscopes

6 models listed

Nanoscale infrared spectroscopy system-Bruker Corporation

Nanoscale infrared spectroscopy system

Bruker Corporation

490+ people viewing

Response time: 24.53 hours

Atomic Force Microscopes

12 models listed

AFM / SPM / nanoIR probe-Bruker Corporation

AFM / SPM / nanoIR probe

Bruker Corporation

560+ people viewing

Response time: 24.53 hours

6 models listed

Nanomechanical property evaluation system Platform type nanoindenter-Bruker Corporation

Nanomechanical property evaluation system Platform type nanoindenter

Bruker Corporation

420+ people viewing

Last viewed: 9 hours ago

Response time: 24.53 hours

3 models listed

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter-Bruker Corporation

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter

Bruker Corporation

480+ people viewing

Last viewed: 20 hours ago

Response time: 24.53 hours

Transmission Electron Microscopes

4 models listed

Multifunctional friction and wear tester UMT TriboLab-Bruker Corporation

Multifunctional friction and wear tester UMT TriboLab

Bruker Corporation

390+ people viewing

Last viewed: 7 hours ago

Response time: 24.53 hours

Friction Testers

3 models listed

White light interference microscope for large samples NPFLEX-1000-Bruker Corporation

White light interference microscope for large samples NPFLEX-1000

Bruker Corporation

340+ people viewing

Last viewed: 11 hours ago

Response time: 24.53 hours

Microscopes

2 models listed

Microscope FT-IR LUMOS II-Bruker Corporation

Microscope FT-IR LUMOS II

Bruker Corporation

210+ people viewing

Last viewed: 19 hours ago

Response time: 24.53 hours

Infrared Microscopes

2 models listed


View more products of Bruker Corporation

About Company Handling This Product

Bruker Corporation

Company Overview

Bruker, founded in 1960 and based in Billerica, Massachusetts, is a manufacturer and distributor of scientific...

See More

  • United States of America

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2025 Metoree