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Flying probe tester APT-1600FD-SL-A-APT-1600FD-SL-A
Flying probe tester APT-1600FD-SL-A-Takaya Co., Ltd.

Flying probe tester APT-1600FD-SL-A
Takaya Co., Ltd.

🚗 Automotive & Transport Use 💻 Electronics & Electrical Use 🚀 Aerospace Industry Use

About This Product

■Continuing to evolve testing capabilities

This is a flying probe type in-circuit tester that reliably detects any defects on mounted boards with ultra-high-speed inspection. Takaya Corporation developed and began selling this "Flying Probe Tester" in 1987. We are a pioneer in the mounted board inspection machine industry, and even today we boast one of the top market shares in the industry. We have an extensive lineup that can meet all inspection needs, including high-speed, high-precision inspection, double-sided inspection, large and heavy board support, and special customization. We will continue to develop products that respond to the diversification of mounted board inspections and even faster speeds.

■Strengths of APT-1600FD

1. Simultaneous inspection of both upper and lower sides ・Upper side 4 heads &6 flying probes ・Lower 2 heads & 4 flying probes Combination inspection of up to 6 probes using upper and lower flying probes simultaneously enables inspection of components that require contact at both points on the top and bottom surfaces of the board. Additionally, there is no need for a reversing process when inspecting double-sided printed circuit boards, significantly reducing inspection time. 2. Laser displacement measurement system The height of the board surface and top surface of the component is measured using laser light to reliably discover mounting defects that cannot be detected with in-circuit testing. It also has a function to read the amount of board warpage and automatically correct the probe contact position. 3. Upper and lower AOI (image inspection) Equipped with an AOI function using dual cameras as standard, it optically inspects mounting defects such as missing bypass capacitors that cannot be detected with in-circuit testing. 4. Probe contact control The descending speed of the probe can be controlled in 19 steps. For delicate workpieces such as FPCs, the probe maintains high-speed operation but decelerates at the moment of contact with the board to minimize impact. In addition, if there is a flux coating on the solder surface, hard contact is performed to improve inspection reliability, achieving stable inspection of all types of boards. 5. Compatible with smart factories We offer multiple interfaces that allow easy connection to your factory network. It contributes to continuous improvement of QCD (quality, cost, delivery) in production activities by establishing quick and detailed traceability, visualizing inspection status, and responding quickly to problems.

  • Product

    Flying probe tester APT-1600FD-SL-A
  • Usage Scenarios

    Automotive & Transport Use / Electronics & Electrical Use / Aerospace Industry Use

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1 Models of Flying probe tester APT-1600FD-SL-A

Image Part Number Price (excluding tax) Testable board dimensions Testable board thickness Mounted component height (max.) Resistance Board weight (max.) Board clamp space Frequency Overall dimensions/weight Relay / Photocoupler / Switch element Transformer Zener diode voltage Diode / Transistor / FET Short check Capacitance Open check Impedance/phase angle Inductance PN junction VF measurement DC voltage/current AC voltage
Flying probe tester APT-1600FD-SL-A-Part Number-APT-1600FD-SL-A

APT-1600FD-SL-A

Available upon quote

L50 × D50mm - L635 × D610mm

0.6 - 5.0mm

Top/bottom 60mm

5mΩ~50MΩ *Custom 2mΩ~

10kg

Top surface: 3mm from the back/front edge
Bottom surface: 7mm from the back/front edge

1Hz~20MHz/2V~20Vp-p

W1,520×D1,620×H1,400mm 1,600kg

ON test

Inductance, turns ratio, phase difference

0.1V~40V (option: up to max.80V)

PN junction VF measurement, ON test, gain, characteristics

Threshold value can be set from 1Ω to 500KΩ (standard 10Ω or less)

0.5pF~200mF

Threshold value can be set from 5Ω to 50MΩ (standard 100Ω or more)

2.5Ω~3.3MΩ / ±90°

0.5μH~500H

0.1V~40V

±125V / ±1A (option: up to ±2A)

150mV~75Vrms,f=10Hz~0.5MHz

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