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Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)-HV-PFM
Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)-Oxford Instruments Ltd.

Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)
Oxford Instruments Ltd.

Oxford Instruments Ltd.'s Response Status

Response Rate

100.0%

Response Time

24.8hours

Relatively Fast Response


About This Product

■Summary

・Cypher AFM's HV-PFM option enables high sensitivity, high bias, and crosstalk-free measurements of piezoelectric materials such as ferroelectrics and multiferroics. -Kit includes built-in high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilever.

■Features

・Measurement without crosstalk ・High speed and high sensitivity ・Uses proprietary technology Dual AC Resonance Tracking (DART) ・Maximum bias application to the tip: ±150 V

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    Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)

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1 Models of Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)

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Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)-Part Number-HV-PFM

HV-PFM

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About Company Handling This Product

Response Rate

100.0%


Response Time

24.8hrs


Company Review

5.0
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