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  2. Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM) (Oxford Instruments Ltd.)
Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)-HV-PFM
Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)-Oxford Instruments Ltd.

Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)
Oxford Instruments Ltd.

About This Product

■Summary

・Cypher AFM's HV-PFM option enables high sensitivity, high bias, and crosstalk-free measurements of piezoelectric materials such as ferroelectrics and multiferroics. -Kit includes built-in high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilever.

■Features

・Measurement without crosstalk ・High speed and high sensitivity ・Uses proprietary technology Dual AC Resonance Tracking (DART) ・Maximum bias application to the tip: ±150 V

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    Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)

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1 Models of Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)

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Nanoscale electrical property evaluation High voltage piezoelectric response microscope (HV-PFM)-Part Number-HV-PFM

HV-PFM

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Oxford Instruments Ltd.

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