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  2. Measuring mechanical and thermal properties at the nanoscale High-speed force mapping mode (Oxford Instruments Ltd.)
Measuring mechanical and thermal properties at the nanoscale High-speed force mapping mode-Fast force mapping mode
Measuring mechanical and thermal properties at the nanoscale High-speed force mapping mode-Oxford Instruments Ltd.

Measuring mechanical and thermal properties at the nanoscale High-speed force mapping mode
Oxford Instruments Ltd.

About This Product

■Summary

- Fast force-distance curve mapping mode measures force curves at fast (up to 300 Hz) pixel rates and captures the entire force curve in the image. -Analytical models can be applied in real time and offline. (Only compatible with MFP-3D Infinity)

■Features

- Force mapping mode operating at pixel rates up to 300 Hz - Captures all force curves in the image, no curve loss or hidden data manipulation - Analytical models for calculating elastic modulus, adhesion, and other properties can be applied in real time and offline. These models can be modified by the user ・Suitable for samples from 10 kPa to 100 GPa

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    Measuring mechanical and thermal properties at the nanoscale High-speed force mapping mode

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1 Models of Measuring mechanical and thermal properties at the nanoscale High-speed force mapping mode

Image Part Number Price (excluding tax)
Measuring mechanical and thermal properties at the nanoscale High-speed force mapping mode-Part Number-Fast force mapping mode

Fast force mapping mode

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Oxford Instruments Ltd.

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