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  2. External application to the sample Electrical probe station (Oxford Instruments Ltd.)
External application to the sample Electrical probe station-Electrical probe station
External application to the sample Electrical probe station-Oxford Instruments Ltd.

External application to the sample Electrical probe station
Oxford Instruments Ltd.

About This Product

■Summary

・By installing the probe station on the MFP-3D scanner, you can easily perform electrical probing, electrical bias, and other measurements on the sample while scanning AFM/SPM. ・Various electrical connections are possible and can be combined with various imaging modes.

■Features

・Easily perform electrical probing while scanning the sample ・Easy to attach to MFP-3D stage

  • Product

    External application to the sample Electrical probe station

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1 Models of External application to the sample Electrical probe station

Image Part Number Price (excluding tax)
External application to the sample Electrical probe station-Part Number-Electrical probe station

Electrical probe station

Available upon quote

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About Company Handling This Product

Oxford Instruments Ltd.

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