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  2. Scanning thermal microscope enables high-resolution single-point and mapping measurements of temperature and thermal conductivity (Oxford Instruments Ltd.)
Scanning thermal microscope enables high-resolution single-point and mapping measurements of temperature and thermal conductivity-Scanning Thermal Microscopy (SThM)
Scanning thermal microscope enables high-resolution single-point and mapping measurements of temperature and thermal conductivity-Oxford Instruments Ltd.

Scanning thermal microscope enables high-resolution single-point and mapping measurements of temperature and thermal conductivity
Oxford Instruments Ltd.

About This Product

Silicon microfabricated probe and SThM probe holder for the MFP-3D AFM/SPM atomic force microscope family provides higher resolution single point and mapping measurements of temperature and thermal conductivity than traditional Wollaston wire probes. becomes possible.

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    Scanning thermal microscope enables high-resolution single-point and mapping measurements of temperature and thermal conductivity

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1 Models of Scanning thermal microscope enables high-resolution single-point and mapping measurements of temperature and thermal conductivity

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Scanning thermal microscope enables high-resolution single-point and mapping measurements of temperature and thermal conductivity-Part Number-Scanning Thermal Microscopy (SThM)

Scanning Thermal Microscopy (SThM)

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Oxford Instruments Ltd.

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