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  2. Scanning microwave impedance microscopy (sMIM) enables mapping of nanoscale permittivity and conductivity in metals, semiconductors, and insulators (Oxford Instruments Ltd.)
Scanning microwave impedance microscopy (sMIM) enables mapping of nanoscale permittivity and conductivity in metals, semiconductors, and insulators-Scanning microwave impedance microscopy (sMIM)
Scanning microwave impedance microscopy (sMIM) enables mapping of nanoscale permittivity and conductivity in metals, semiconductors, and insulators-Oxford Instruments Ltd.

Scanning microwave impedance microscopy (sMIM) enables mapping of nanoscale permittivity and conductivity in metals, semiconductors, and insulators
Oxford Instruments Ltd.

About This Product

SMIM (Scanning Microwave Impedance Microscopy) enables mapping of nanoscale permittivity and conductivity in metals, semiconductors, and insulators (available on all MFP-3D models except MFP-3D Origin). correspondence) .

■Features

・Improved lateral resolution (50 nm or less), excellent signal-to-noise ratio (10 times or more) - Operates up to 80x faster and with lower power than competing technologies

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    Scanning microwave impedance microscopy (sMIM) enables mapping of nanoscale permittivity and conductivity in metals, semiconductors, and insulators

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1 Models of Scanning microwave impedance microscopy (sMIM) enables mapping of nanoscale permittivity and conductivity in metals, semiconductors, and insulators

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Scanning microwave impedance microscopy (sMIM) enables mapping of nanoscale permittivity and conductivity in metals, semiconductors, and insulators-Part Number-Scanning microwave impedance microscopy (sMIM)

Scanning microwave impedance microscopy (sMIM)

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