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  2. MFP-3D Accessory Enables evaluation of dielectric breakdown characteristics with nanoscale precision Nanoscale dielectric film breakdown over time (NanoTDDB) (Oxford Instruments Ltd.)
MFP-3D Accessory Enables evaluation of dielectric breakdown characteristics with nanoscale precision Nanoscale dielectric film breakdown over time (NanoTDDB)-Nanoscale dielectric film breakdown over time (NanoTDDB)
MFP-3D Accessory Enables evaluation of dielectric breakdown characteristics with nanoscale precision Nanoscale dielectric film breakdown over time (NanoTDDB)-Oxford Instruments Ltd.

MFP-3D Accessory Enables evaluation of dielectric breakdown characteristics with nanoscale precision Nanoscale dielectric film breakdown over time (NanoTDDB)
Oxford Instruments Ltd.

About This Product

■Summary

・NanoTDDB™ enables dielectric breakdown characterization with nanoscale precision. - Apply a constant or ramped bias voltage up to ±220 V while monitoring the current flowing through the conductive AFM probe (available on all MFP-3D models except MFP-3D Origin. MFP-3D Infinity voltage range is ±150 V).

■Features

・The excellent spatial resolution of the AFM probe enables local measurement of dielectric breakdown on minute length scales (~20 nm), which is impossible with conventional probe stations. - Accurately select measurement points from high-resolution images and map grid points for analysis

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    MFP-3D Accessory Enables evaluation of dielectric breakdown characteristics with nanoscale precision Nanoscale dielectric film breakdown over time (NanoTDDB)

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1 Models of MFP-3D Accessory Enables evaluation of dielectric breakdown characteristics with nanoscale precision Nanoscale dielectric film breakdown over time (NanoTDDB)

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MFP-3D Accessory Enables evaluation of dielectric breakdown characteristics with nanoscale precision Nanoscale dielectric film breakdown over time (NanoTDDB)-Part Number-Nanoscale dielectric film breakdown over time (NanoTDDB)

Nanoscale dielectric film breakdown over time (NanoTDDB)

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