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Mechanical property measurement (nanomechanics) & thermal property measurement Contact resonance viscoelastic mapping mode for Cypher AFM-Contact resonance viscoelastic mapping mode for Cypher AFM
Mechanical property measurement (nanomechanics) & thermal property measurement Contact resonance viscoelastic mapping mode for Cypher AFM-Oxford Instruments Ltd.

Mechanical property measurement (nanomechanics) & thermal property measurement Contact resonance viscoelastic mapping mode for Cypher AFM
Oxford Instruments Ltd.

Oxford Instruments Ltd.'s Response Status

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100.0%

Response Time

24.8hours

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About This Product

■Summary

・Contact Resonance Viscoelastic Mapping Mode for Cypher AFM is suitable for materials with an elastic modulus of around 1 GPa to 100 GPa, and can quantitatively map both elastic and viscoelastic damping. Masu. Asylum Research's proprietary technologies, including Dual AC Resonance Tracking (DART) and Band Excitation, increase the sensitivity and accuracy of this technique. ・Piezoelectric actuation (sample or cantilever) or blueDrive photothermal excitation enables broadband, frequency-independent, and accurate actuation.

■Features

・Measure both storage modulus E’ and loss modulus E’’ using contact mode technique ・Applicable to samples from 1 GPa to 300 GPa

  • Product

    Mechanical property measurement (nanomechanics) & thermal property measurement Contact resonance viscoelastic mapping mode for Cypher AFM

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1 Models of Mechanical property measurement (nanomechanics) & thermal property measurement Contact resonance viscoelastic mapping mode for Cypher AFM

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Contact resonance viscoelastic mapping mode for Cypher AFM

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Response Rate

100.0%


Response Time

24.8hrs


Company Review

5.0
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