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  2. Measuring mechanical and thermal properties at the nanoscale Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM (Oxford Instruments Ltd.)
Measuring mechanical and thermal properties at the nanoscale Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM-Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM
Measuring mechanical and thermal properties at the nanoscale Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM-Oxford Instruments Ltd.

Measuring mechanical and thermal properties at the nanoscale Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM
Oxford Instruments Ltd.

About This Product

■Summary

・Contact Resonance Viscoelastic Mapping Mode for MFP-3D AFM/SPM is suitable for materials with elastic moduli from approximately 1 GPa to 300 GPa, quantifying both elastic and viscoelastic damping. map. Asylum Research's proprietary technologies, including Dual AC Resonance Tracking (DART) and Band Excitation, increase the sensitivity and accuracy of this technique. ・Accurate, broadband and frequency-independent drive is possible for either the tip or the sample.

■Features

・Measure both storage modulus E’ and loss modulus E’’ using contact mode technique ・Applicable to samples from 1 GPa to 300 GPa ・Line scan rate 0.1~2 Hz

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    Measuring mechanical and thermal properties at the nanoscale Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM

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1 Models of Measuring mechanical and thermal properties at the nanoscale Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM

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Measuring mechanical and thermal properties at the nanoscale Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM-Part Number-Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM

Contact resonance viscoelastic mapping mode for MFP-3D AFM/SPM

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