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  2. Integrated software for equipment control and data analysis WITec Suite SIX (Oxford Instruments Ltd.)
Integrated software for equipment control and data analysis WITec Suite SIX-WITec Suite SIX
Integrated software for equipment control and data analysis WITec Suite SIX-Oxford Instruments Ltd.

Integrated software for equipment control and data analysis WITec Suite SIX
Oxford Instruments Ltd.

Oxford Instruments Ltd.'s Response Status

Response Rate

100.0%

Response Time

24.8hours

Company Review

5.0

Relatively Fast Response

About This Product

■Summary

・Suite SIX is the latest version of WITec's integrated software environment for device control and data analysis. ・All WITec instruments, including the alpha300 series Raman imaging, AFM, SNOM microscopes, RISE (Raman SEM), and cryolaman systems, have an intuitive operating concept. Other imaging modes such as profilometry and time-correlated single photon counting (TCSPC) for fluorescence lifetime imaging (FLIM) and anti-bunching experiments are also supported. With WITec Suite SIX, everything from setup to results has never been easier. Manage your entire experiment from initial setup to data acquisition and post-processing with one integrated software. Basic and advanced data analysis capabilities accelerate the generation of high-quality images. WITec's modular software and hardware architecture allows users to quickly configure equipment for specific tasks.

■Main advantages

・Integrated software suite for instrument setup, data collection and post-processing for all WITec microscopes ・Intuitive and tactile operability of hardware and software using EasyLink handheld controller ・High-speed acquisition of large amounts of data ・Multi-user management to clarify access rights associated with each user account ・Configuration library settings that support repeated tasksConfiguration library settings ・Guidance for all processes of data processing and image generation (Software Wizard) ・TrueOrigin portable coordinate system makes it easy to locate the same sample area on different microscopes - Images from different measurements can be superimposed to correlate chemical information from Raman with surface information from SEM, AFM, and TrueSurface profilometry. ・Advanced image post-processing functions

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    Integrated software for equipment control and data analysis WITec Suite SIX

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1 Models of Integrated software for equipment control and data analysis WITec Suite SIX

Image Part Number Price (excluding tax)
Integrated software for equipment control and data analysis WITec Suite SIX-Part Number-WITec Suite SIX

WITec Suite SIX

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About Company Handling This Product

Oxford Instruments Ltd.

Response Rate

100.0%

Response Time

24.8hrs

Company Review

5.0
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