Measure Raman and surface topography in one pass Topographic Raman Imaging TrueSurface
Oxford Instruments Ltd.
About This Product
■Measure Raman and surface topography in one pass
WITec's patented TrueSurface method allows Raman imaging to be performed along the surface shape of a sample. Topographic Raman Imaging incorporates an optical profilometer into a Raman instrument and can measure Raman and surface topography in one pass.
■TrueSurface method principle
・Raman measurement scanning can be performed on rough surfaces, tilted samples, and irregularly shaped samples without special sample surface treatment.
・In a confocal microscope, incident light from sources other than the focal point is largely blocked by the pinhole.
・TrueSurface module maintains focus on the sample surface during scanning, regardless of sample shape.
・An optical sensor controls the distance between the sample and the objective lens with submicron precision.
-This allows accurate distance control and sharp images even in measurements that require long integration times.
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Product
Measure Raman and surface topography in one pass Topographic Raman Imaging TrueSurface
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Handling Company
Oxford Instruments Ltd.
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1 Models of Measure Raman and surface topography in one pass Topographic Raman Imaging TrueSurface
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TrueSurface |
Available upon quote |
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About Company Handling This Product
- Japan