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  2. Symmetry S3®, an EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology (Oxford Instruments Ltd.)
Symmetry S3®, an EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology-Symmetry S3®
Symmetry S3®, an EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology-Oxford Instruments Ltd.

Symmetry S3®, an EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology
Oxford Instruments Ltd.

Oxford Instruments Ltd.'s Response Status

Response Rate

100.0%

Response Time

24.8hours

Company Review

5.0

Relatively Fast Response

About This Product

■Summary

Symmetry S3 uses a customized CMOS sensor and fiber optics to deliver a unique and powerful combination of speed, sensitivity, and fine diffraction patterns. ・In combination with AZtec software, it provides excellent performance in all types of measurements on all materials. Symmetry S3's analysis speeds of up to over 5,700 pps enable texture and grain size characterization in seconds, but are achieved without requiring high beam currents or sacrificing pattern resolution, allowing for the characterization of texture and grain size in multiphase light metal alloys. This means that such high speeds are possible even for difficult samples such as deformed steel. ・In addition, distortion-free megapixel resolution EBSP can be collected for detailed strain and crystal phase analysis. - Innovative features such as software-controlled detector tilt (with dynamic calibration) and a unique proximity sensor make the detector suitable for any application.

■Features

- Guaranteed maximum indexing speed > 5,700 patterns per second (pps) ・Optical fiber lens provides unparalleled sensitivity ・Maximum sensitivity > 1,000 pps / nA ・Pattern resolution at fastest analysis: 156 x 128 pixels ・Full megapixel resolution (1,244 x 1,024) pattern: High angular resolution (HR) Ideal for strain analysis requiring EBSD ・Achieves angular accuracy of 0.05° or less with sub-pixel level distortion Software-controlled detector tilt interface with automatic calibration – optimal detector positioning and indexing for all specimens and geometries ・Unique proximity sensor: Detects potential collisions in advance and automatically moves the detector to a safe position -Five integrated forward scatter electron detectors (optional) provide full-color complementary channeling contrast and atomic number contrast images ・Maintain vacuum level of electron microscope with bellows SEM interface ・Simple and intuitive detector settings ensure optimal results every time

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    Symmetry S3®, an EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology

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Symmetry S3®

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About Company Handling This Product

Oxford Instruments Ltd.

Response Rate

100.0%

Response Time

24.8hrs

Company Review

5.0
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