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  2. Symmetry S2® EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology (Oxford Instruments Ltd.)
Symmetry S2® EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology-Symmetry S2®
Symmetry S2® EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology-Oxford Instruments Ltd.

Symmetry S2® EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology
Oxford Instruments Ltd.

About This Product

■Summary

Symmetry S2 uses a customized CMOS sensor and fiber optics to deliver a unique and powerful combination of speed, sensitivity, and fine diffraction patterns. ・In combination with AZtec software, it provides excellent performance in all types of measurements on all materials. Symmetry S2's analysis speeds of up to over 4,500pps enable texture and grain size characterization in seconds, but are achieved without requiring high beam currents or sacrificing pattern resolution, allowing for texture and grain size characterization in multiphase light metal alloys. This means that even difficult samples such as deformed steel can be processed at high speeds. - Collect distortion-free megapixel resolution EBSP for detailed strain and crystalline phase analysis. - Innovative features such as software-controlled detector tilt (with dynamic calibration) and a unique proximity sensor make the detector suitable for any application.

■Features

- Guaranteed maximum indexing speed > 4,500 patterns per second (pps) ・Optical fiber lens provides unparalleled sensitivity ・Maximum sensitivity > 800 pps/nA ・Pattern resolution at fastest analysis: 156 x 88 pixels ・Full megapixel resolution (1,244 x 1,024) pattern: High angular resolution (HR) Ideal for strain analysis requiring EBSD ・Achieves angular accuracy of 0.05° or less with sub-pixel level distortion Software-controlled detector tilt interface with automatic calibration – optimal detector positioning and indexing for all specimens and geometries ・Unique proximity sensor: Detects potential collisions in advance and automatically moves the detector to a safe position -Five integrated forward scatter electron detectors (optional) provide full-color complementary channeling contrast and atomic number contrast images ・Maintain vacuum level of electron microscope with bellows SEM interface ・Simple and intuitive detector settings ensure optimal results every time

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    Symmetry S2® EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology

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1 Models of Symmetry S2® EBSD detector based on the Symmetry detector and equipped with cutting-edge CMOS technology

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Symmetry S2®

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