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Highly reproducible measurements Jupiter XR AFM/SPM accessories-NanoTDDB
Highly reproducible measurements Jupiter XR AFM/SPM accessories-Oxford Instruments Ltd.

Highly reproducible measurements Jupiter XR AFM/SPM accessories
Oxford Instruments Ltd.


About This Product

■Summary

The nanoTDDB function of Jupiter You can apply constant or ramped voltages up to ±150V while monitoring the current flowing through the conductive AFM probe.

■Features

・The excellent spatial resolution of the AFM tip makes it possible to measure local dielectric breakdown on a microscale (~20nm), which is impossible with conventional probers. - It is possible to accurately specify measurement points from high-resolution AFM images and map the specified points with a grid.

  • Product

    Highly reproducible measurements Jupiter XR AFM/SPM accessories

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1 Models of Highly reproducible measurements Jupiter XR AFM/SPM accessories

Image Part Number Price (excluding tax)
Highly reproducible measurements Jupiter XR AFM/SPM accessories-Part Number-NanoTDDB

NanoTDDB

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