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  2. Solutions for cutting-edge nanoanalysis EDS for SEM and FIB (Oxford Instruments Ltd.)

Solutions for cutting-edge nanoanalysis EDS for SEM and FIB
Oxford Instruments Ltd.

About This Product

We provide solutions ranging from routine EDS microanalysis that requires high throughput to cutting-edge nanoanalysis where performance is important.

■Features

・UltimMax is equipped with a next-generation silicon drift detector including a 170mm2 SDD, which boasts the world's largest detection element area. -Delivering rapid data collection for live EDS analysis, Xplore ensures reliable results required for routine analysis applications. - We provide easy-to-use solutions specialized in various fields such as gunshot residue, mineral relief, thin film analysis, etc. ・Live chemical imaging is an innovative elemental analysis solution.

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    Solutions for cutting-edge nanoanalysis EDS for SEM and FIB

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1 Models of Solutions for cutting-edge nanoanalysis EDS for SEM and FIB

Image Part Number Price (excluding tax)

EDS/EDX for SEM/FIB

Available upon quote

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Oxford Instruments Ltd.

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