Product
OmniProbe Reliable 9th generation nanomanipulatorHandling Company
Oxford Instruments Ltd.Categories
Items marked with have different values depending on the model number.
Click on the part number for more information about each product
Product Image | Part Number | Price (excluding tax) | Backside Thinning | Built-in temperature sensor | Concentric rotation | Cryogenic lift out | EBAC measurement | EBIC measurement | Encoder resolution | In situ chip exchange | Insertion reproducibility | Linearity | Maximum speed | Minimum speed | Neutralization of charge | On-Tip analysis | Plan-view | Pretreatment of atom probe tomography samples | Site specific lift-out | Vent free plan-view | Voltage contrast imaging |
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Cryo lift-out |
Available upon quote | ✘ | ✔ | ✘ | ✔ | ✘ | ✘ | <50nm | ✘ | 15μm* | 500nm | 250μm/s | 50nm/s | ✔ | ✘ | P | P | ✔ | ✘ | ✘ | |
OmniProbe 350 |
Available upon quote | ✘ | ✘ | ✘ | ✘ | O | O | <50nm | O | 5μm | 500nm | 250μm/s | 50nm/s | ✔ | ✘ | P | P | ✔ | ✘ | ✔ | |
OmniProbe 400 |
Available upon quote | P | ✘ | ✔ | ✘ | O | O | 10nm | ✔ | 2μm | 250nm | 500μm/s | 10nm/s | ✔ | ✔ | ✔ | ✔ | ✔ | ✔ | ✔ |
Click on the part number for more information about each product