Observe shape images and Raman images with one device alpha300 RA – AFM Raman combined device-Alpha300RA–AFM
Observe shape images and Raman images with one device alpha300 RA – AFM Raman combined device-Oxford Instruments Ltd.

Observe shape images and Raman images with one device alpha300 RA – AFM Raman combined device
Oxford Instruments Ltd.


About This Product

■An epoch-making device that allows you to observe shape images and Raman images with one device. AFM Raman, which has become well-known in recent years, was first introduced to the market by the alpha300RA, which remains the standard AFM Raman multifunction printer today. The alpha300RA has the functions of both the chemical imaging tool alpha300R and the alpha300A atomic force microscope that can obtain high-resolution surface topography at the nano-level, making it possible to comprehensively analyze samples. The alpha300RA combines AFM and Raman imaging capabilities in one instrument, integrated by the purpose-built, easy-to-use and reliable SUITE software. To switch between AFM and Raman imaging functions, simply change the objective lens with a revolver and change the measurement parameters from the software, and you can easily identify the same area. AFM images and Raman images can also be displayed overlaid on the software. Furthermore, TERS, which allows high-resolution Raman imaging, and simultaneous AFM and Raman measurements are also possible. ■Features ・Achieves all functions of alpha300R (confocal Raman microscope) and alpha300A (AFM) in one unit ・Nanoscale surface morphology (AFM) and chemical imaging (Raman) are obtained for comprehensive surface analysis. ・Simultaneous AFM and Raman measurement possible ・Turn the microscope revolver to change the objective lens and change the measurement mode. ・No need to change samples for AFM and Raman measurements ■Observation mode ・Raman imaging: Obtain Raman spectra at all points of image pixels ・Plane (x-y-direction) depth (z-direction) scanning ・Stacked image: 3D confocal Raman image ・Time series measurement ・Raman spectrum measurement at designated locations ・One-dimensional Raman depth profiling measurement ・Ultra high-speed Raman imaging (1300 spectrum measurements/sec) option ・Confocal fluorescence microscope ・Bright field microscope ・Dark field microscope, phase contrast, DIC option ・Upgradable to epifluorescence microscope ■AFM mode ・Contact mode ・AC mode (tapping mode) ・Digital pulse force mode (DPFM) ・Lift Mode™ ・Magnetic force microscope (MFM) ・Electrostatic force microscope (EFM), etc. ■Features of WITec TERS ・Raman and AFM are WITec's own products and are highly reliable. - Optical excitation of the sample can be applied both upward and downward.

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    Observe shape images and Raman images with one device alpha300 RA – AFM Raman combined device

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1 Models of Observe shape images and Raman images with one device alpha300 RA – AFM Raman combined device

Product Image Part Number Price (excluding tax) Computer, software Microscope Sample size TERS (Tip Enhanced Raman)
Observe shape images and Raman images with one device alpha300 RA – AFM Raman combined device-Part Number-Alpha300RA–AFM

Alpha300RA–AFM

Available upon quote Equipment control, data collection software, data analysis evaluation software ・Research grade optical microscope with 6-objective lens revolver
・Video system: Eyepiece color video camera
・White LED Keller lighting
・XY direction manual sample stage X,Y25mm
・Active vibration isolation table included, etc.
Length and width: 120mm, thickness: 25mm, thicker samples can be accommodated with an adapter The device is ideal for TERS experiments as it has both Raman and AFM functions in one device.

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