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Visual display of plating attachment distribution of measurements Fluorescent X-win membrane thick meter EX-851/EX-731Handling Company
SANKO ELECTRONIC LABORATORY CO.,LTDCategories
Click on the part number for more information about each product
| Image | Part Number | Price (excluding tax) | Table size | Movable amount x | Movable amount Y | Sample load | filter | Collimeter | Body dimensions | weight | Moving amount Z | Maximum height measurement | power supply | Sample observation | Safety function | Automatic table function | Other features | Correction function | Calibration line | Measurement target | Measured range | Measurement function | Irradiation method | application | Data processing function | Detector | X -ray source |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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EX-851 |
Available upon quote |
200 x 200mm |
200mm |
200mm |
2kg |
2 types (Co, NI) Automatic switching |
5 types: 0.1, 0.2, 0.5, 1.0, 2.0φmm, options: 0.05, 0.1, 0.3, 0.3, 0.5, φ |
740 (W) x 530 (D) x 660 (H) mm |
85kg |
90mm |
90mm |
AC100V ± 10V |
CCD color camera (auto focus) |
X -ray power Keis switch/fail -safe function |
Auto focus/measurement position specification (X-Y-Z)/Original correction function/measuring position confirmation function/automatic softening |
Stage coordinates/device maintenance maintenance |
Base correction |
Certificate line automatic creation function/multi -point calibration line |
Atomic number 22 (Ti) ~ 82 (PB) Atomic number 21 or less can be measured by absorption method |
Atomic number 22 ~ 24: 0.02 ~ about 20 μm, atom number 25 ~ 40: 0.02 ~ about 30 μm, atomic number 41 ~ 51: 0.02 ~ about 70 μm, atom number 52 ~ 83: 0.01 ~ about 10 μm |
Automatic measurement/output style setting/spectral measurement/2 points distance measurement |
Upper surface vertical irradiation method |
Single -layer measurement/2 -layer plating measurement/3 layer plating measurement/aggregation thickening component simultaneous measurement/electric solution nickel measurement |
Statistics display: Average, standard deviation, maximum, minimum, range, CP, CPK/histogram/profile display/measuring data 3D display/X-R management diagram |
Proportional quantity tube |
Oil -soaked small microtum focus X -ray tube, target: tungsten, pipe voltage 50kV, pipe current variable |
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EX-731 |
Available upon quote |
Manual stage: 170 x 110mm, automatic stage: 240 x 220mm |
Manual stage: 70mm, automatic stage: 200mm |
Manual stage: 70mm, automatic stage: 200mm |
Manual stage: 3kg, automatic stage: 1kg |
2 types (Co, NI) Automatic switching |
5 types (automatic switching formula): 0.1, 0.2, 0.5, 1.0, 2.0φmm, options: 0.05 × 0.5, 0.05φ |
600 (W) x 465 (D) x 754 (H) mm |
Manual stage: 79kg, automatic stage: 85kg |
Manual stage: 80mm, automatic stage: 50mm |
Manual stage: 80 (options 150) mm, automatic stage: 50mm |
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CCD color camera (auto focus) |
X -ray power Keis switch/fail -safe function |
- |
Stage coordinates/device maintenance maintenance |
Base correction |
Certificate line automatic creation function/multi -point calibration line |
Atomic number 22 (Ti) ~ 82 (PB) Atomic number 21 or less can be measured by absorption method |
Atomic number 22 ~ 24: 0.02 ~ about 20 μm, atom number 25 ~ 40: 0.02 ~ about 30 μm, atomic number 41 ~ 51: 0.02 ~ about 70 μm, atom number 52 ~ 83: 0.01 ~ about 10 μm |
Automatic measurement/output style setting/automatic measurement condition setting/spectrum measurement/2 points distance measurement |
Upper surface vertical irradiation method |
Single -layer measurement/2 -layer plating measurement/3 layer plating measurement/aggregation thickening component simultaneous measurement/electric solution nickel measurement |
Statistics display: Average, standard deviation, maximum, minimum, range, CP, CPK/histogram/profile display/measuring data 3D display/X-R management diagram |
Proportional quantity tube |
Oil -soaked small microscopic focus X -ray tube, target: tungsten, pipe voltage 50kV, pipe current: up to 1.2mA |
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