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Microscope related equipment Single crystal diamond probe for AFM-ART D10
Microscope related equipment Single crystal diamond probe for AFM-Kimball Physics Inc.

Microscope related equipment Single crystal diamond probe for AFM
Kimball Physics Inc.


About This Product

■“Single crystal diamond probe for AFM (ART SCD Probes)” manufactured by Artech Carbon LLC

Artech Carbon LLC single crystal diamond probes (ART SCD Probes) are probes developed for AFM. Manufactured by growing an SCD (Single Crystal Diamond) chip on a silicon cantilever using the CVD method. Using our unique technology, we have made it possible to produce a tip (probe) with a high aspect ratio and a sharp tip. Since the tip is made of diamond, it has high wear resistance and can stably obtain high-resolution images.

■Chip (probe) specifications

・Material: Single crystal diamond ・Aspect ratio: 5:1 ・Overall angle: 10° ・Tip curvature radius: 5 to 10 nm

■Overall specifications

・Conductivity: None ・Heat-resistant temperature: 70℃ ・Cantilever size: 1.6 mm x 3.4 mm x 0.4 mm ・Cantilever material: silicone ・The back of the cantilever is coated with aluminum.

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    Microscope related equipment Single crystal diamond probe for AFM

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1 Models of Microscope related equipment Single crystal diamond probe for AFM

Image Part Number Price (excluding tax) AFM mode Spring constant (N/m) Resonant frequency (kHz)
Microscope related equipment Single crystal diamond probe for AFM-Part Number-ART D10

ART D10

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0.15

10

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