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Microscope related equipment SPM probe/cantilever-NSC14
Microscope related equipment SPM probe/cantilever-Kimball Physics Inc.

Microscope related equipment SPM probe/cantilever
Kimball Physics Inc.


About This Product

■“SPM probe/cantilever” manufactured by MIKROMASCH

Micromash offers a wide range of AFM probes. We offer a wide range of products, including regular silicon cantilevers with various coatings, high-resolution probes mounted on cantilevers of various shapes and mechanical properties, conductive probes, and magnetic probes. In addition to the regular type (HQ cantilever), a type with a tip attached to the cantilever tip (OPUS cantilever) has been added to the lineup. By using the OPUS cantilever, the position of the sample surface to be scanned is known precisely. OPUS cantilevers can be ordered in units of 10, 24, 50, and 100 pieces.

■Chip type

・Multi-purpose use ・Tipless cantilever ・Long distance scanning applications ・Continuous operation use/conductive type ・Electrical measurement use/high resolution type ・Electrical measurement use/low noise type ・Electrical measurement use/platinum/gold coating type ・Magnetic applications ・High resolution ・Silicon nitride (safe silicon)

■Multi-purpose use

The pyramid-shaped etched silicone provides a sharp tip tip and stable resonant frequency, making it ideal for various types of AFM, mainly dynamic AFM. This type of product has various specifications of resonant frequency and spring constant.

■Chip specifications

・Chip radius: ~8 nm ・Chip material: Silicon

  • Product

    Microscope related equipment SPM probe/cantilever

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1 Models of Microscope related equipment SPM probe/cantilever

Image Part Number Price (excluding tax) Cantilever thickness (T±0.5um) Cantilever width (W±3um) Cantilever length (L±5um) Spring constant N/m (average) Resonance frequency kHz (average)
Microscope related equipment SPM probe/cantilever-Part Number-NSC14

NSC14

Available upon quote

2.1

Twenty five

125

5

160

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