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Particle property measurement equipment Laser diffraction/scattering method Particle size distribution measurement equipment Wet system LS13320-Wet system LS13320
Particle property measurement equipment Laser diffraction/scattering method Particle size distribution measurement equipment Wet system LS13320-Nikkaki Bios Co., Ltd.

Particle property measurement equipment Laser diffraction/scattering method Particle size distribution measurement equipment Wet system LS13320
Nikkaki Bios Co., Ltd.


About This Product

By optimizing and utilizing three measurement methods: PIDS theory, Mie scattering, and Fraunhofer diffraction method, we provide highly accurate and highly reproducible data that cannot be obtained with ordinary laser diffraction scattering.

■Features

・Measure from 0.017 to 2,000μm at once ・High resolution with 133 detectors installed ・Perform self-diagnosis by the device itself by adjusting the optical axis and offset ・Compatible with various organic solvents ・Auto sampler system for fully automatic measurement of 28 samples ・Dry powder module is also available (measuring range 0.4-2,000μm)

  • Product

    Particle property measurement equipment Laser diffraction/scattering method Particle size distribution measurement equipment Wet system LS13320

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1 Models of Particle property measurement equipment Laser diffraction/scattering method Particle size distribution measurement equipment Wet system LS13320

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Particle property measurement equipment Laser diffraction/scattering method Particle size distribution measurement equipment Wet system LS13320-Part Number-Wet system LS13320

Wet system LS13320

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