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Film thickness meter High speed mapping ellipsometer ME-210-ME-210
Film thickness meter High speed mapping ellipsometer ME-210-Ryokosha Co., Ltd.

Film thickness meter High speed mapping ellipsometer ME-210
Ryokosha Co., Ltd.

Ryokosha Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

31.3hours

Relatively Fast Response


About This Product

■Features

・High speed, high resolution, and high precision. At high speeds of up to 5,000 points per minute or more, it is possible to measure the surface distribution of film thickness, whether it is a minute area of ​​50 um square or an extremely thin film of 1 nm or less. ・Measures the film thickness/refractive index distribution of ultra-thin films at ultra-high speed. - Capable of measuring minute areas of 50 μm square. ・Select small areas by dragging the mouse from wide area data. -Easy operation with simple interface. ・Data output in text and csv format.

■Function

- The included software allows you to easily perform a series of operations such as operating the ME-210, analyzing and saving acquired data, and reloading saved data. - Measured film thickness and refractive index distribution data can be displayed and analyzed in various ways. For example, 2D maps that reflect film thickness in shading and color, 3D map displays that allow you to set the viewpoint at any angle, wire displays, etc. are possible. ・With ME-210, you can measure an arbitrary area in high resolution by dragging the mouse on the data window that measures a wide area. By repeating this operation, you can efficiently find any microscopic area and obtain film thickness information for that area. We are proud of its intuitive operation, just like using map software. Additionally, these measurement data can be output and saved in txt or csv format, so they can be handled with software such as Excel. It is also possible to recalculate the saved data using a different optical model than that used during measurement.

  • Product

    Film thickness meter High speed mapping ellipsometer ME-210

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1 Models of Film thickness meter High speed mapping ellipsometer ME-210

Image Part Number Price (excluding tax)
Film thickness meter High speed mapping ellipsometer ME-210-Part Number-ME-210

ME-210

Available upon quote

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About Company Handling This Product

Response Rate

100.0%


Response Time

31.3hrs

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