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  2. Double-sided microscope positional deviation measurement system TOMOS-60 (Ryokosha Co., Ltd.)
Double-sided microscope positional deviation measurement system TOMOS-60-TOMOS-60
Double-sided microscope positional deviation measurement system TOMOS-60-Ryokosha Co., Ltd.

Double-sided microscope positional deviation measurement system TOMOS-60
Ryokosha Co., Ltd.

Ryokosha Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

27.5hours

Relatively Fast Response

About This Product

■Summary

6 inch stage front and back position deviation measurement system

■Features

・Equipped with a 6-inch XY stage. - For inspection of crystal resonators, MEMS, inkjet nozzles, semiconductor electronic components, etc. - Capable of simultaneously photographing both the front and back sides, measuring dimensions, and measuring positional deviation. ・Front and back optical axis correction is performed with high accuracy using a microstage + software. ・Measures positional deviation between the front and back sides with a repeatability of ±0.3μm or less. (Depends on subject and environmental conditions) - Front and back 2ch autofocus units can be combined. (Optional) ・Electric XY stage control system under development. ・Can also be sold as a double-sided microscope module for installation in equipment.

■Applications

・Observation: Simultaneous observation of front and back surfaces of electronic paper electrophoresis, particles, fluids, etc., video recording, epi-illumination, transmission, epi-illumination + transmission photography possible. Simultaneous observation of front and back sides, image filing, video recording, overlapping display of front and back sides, manual dimension measurement. ・Measurement of dimensions/front/back positional deviation Measurement of front/back positional deviation of printed circuit board through-holes, mesh filters, crystal oscillators, etc., dimension measurement Calibrate front/back camera coordinates and measure positional deviation. Automatically detects edges and measures line width/dimensions of front and back patterns without individual measurement differences.

  • Product

    Double-sided microscope positional deviation measurement system TOMOS-60

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1 Models of Double-sided microscope positional deviation measurement system TOMOS-60

Image Part Number Price (excluding tax)
Double-sided microscope positional deviation measurement system TOMOS-60-Part Number-TOMOS-60

TOMOS-60

Available upon quote

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About Company Handling This Product

Ryokosha Co., Ltd.

Response Rate

100.0%

Response Time

27.5hrs

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