Desktop film thickness meter XDV series
F.I. Tech Co., Ltd.
About This Product
■Features
- High-performance X-ray tube and highly sensitive silicon drift detector (SDD) enable measurement of the thinnest coatings with repeatable accuracy
・Extremely robust structure that supports long-term continuous measurement and has very long-term stability
・Advanced polycapillary X-ray optical lens focuses X-rays into an extremely small measurement spot
・Automatic continuous measurement possible with programmable XY table and Z axis (optional)
- Fast and simple positioning with video imaging and laser pointer support
Main uses
■Film thickness measurement
・Wear-resistant coatings like NiP layers on small watch parts
・Extremely thin precious metal coatings on mechanical watch parts
・Testing of base metallization layer (UBM, Under Bump Metallization) in nanometer range
・Measurement of C4 solder bumps and smaller solder bumps
■Material analysis
・Detection of substances (such as heavy metals) in electronics, packaging, and consumer products according to RoHS, WEEE, CPSIA, and other guidelines
・Composition of functional film. NiP phosphorus content determination, etc.
・Analysis of gold, other precious metals, and their alloys
・Analysis of lead-free solder caps on copper pillars
・Compositional analysis of C4 and small solder bumps, base metallization layers (UBM), and small contact surface measurements in the semiconductor industry
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Product
Desktop film thickness meter XDV series
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Handling Company
F.I. Tech Co., Ltd.
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Categories
1 Models of Desktop film thickness meter XDV series
| Product Image | Part Number | Price (excluding tax) | Measurement method |
|---|---|---|---|
|
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XDV |
Available upon quote | Fluorescent x-ray |
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About Company Handling This Product
- Japan