Desktop type film thickness meter XDL series
F.I. Tech Co., Ltd.
About This Product
■Features
・X-ray fluorescence equipment that can handle various measurement tasks with different hardware components
・Measurement distance can be changed (up to 80 mm), so it is possible to
・Automatic continuous measurement possible with programmable XY table and Z axis (optional)
・Ideal for measuring extremely thin layers. Uses silicon drift detector (XDAL) with high energy resolution
Main uses
■Film thickness measurement
・Measurement of film on large boards and flexible circuit boards
・Thin conductive layer/separation layer of circuit board
・Three-dimensional component film
・Chromium film. Plastic products with decorative chrome finish etc.
■Material analysis
・Electroplating bath analysis
・Functional film analysis for electronics and semiconductor industry
・Analysis of hard material films such as CrN, TiN, TiCN, etc.
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Product
Desktop type film thickness meter XDL series
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Handling Company
F.I. Tech Co., Ltd.
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Categories
1 Models of Desktop type film thickness meter XDL series
| Product Image | Part Number | Price (excluding tax) | Measurement method |
|---|---|---|---|
|
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XDL |
Available upon quote | Fluorescent x-ray |
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About Company Handling This Product
- Japan