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  4. IGBT/SiC power module dynamic characteristics manual inspection device NATS-1630 (Nidek Advanced Technology Co., Ltd.)
IGBT/SiC power module dynamic characteristics manual inspection device NATS-1630-NATS-1630
IGBT/SiC power module dynamic characteristics manual inspection device NATS-1630-Nidek Advanced Technology Co., Ltd.

IGBT/SiC power module dynamic characteristics manual inspection device NATS-1630
Nidek Advanced Technology Co., Ltd.

Nidek Advanced Technology Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

5.6hours

Very Fast Response

About This Product

Wide bandgap measurement technology. Insulation and static property inspection equipment can also be constructed.

■Data traceability

Can be linked with higher-level data management systems such as external PCs and cloud

■Low LS 4.5nH

Achieving the low LS required for SiC-PM inspection with a jig/tester

■Mechanism selection

Manual inspection, inline, loader & unloader specifications available

■Easy operation

・Easy operability with no programming required ・One-touch analysis of waveforms with easy operation

■KGD Test

Eliminate bottlenecks

  • Product

    IGBT/SiC power module dynamic characteristics manual inspection device NATS-1630

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1 Models of IGBT/SiC power module dynamic characteristics manual inspection device NATS-1630

Image Part Number Price (excluding tax)
IGBT/SiC power module dynamic characteristics manual inspection device NATS-1630-Part Number-NATS-1630

NATS-1630

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About Company Handling This Product

Nidek Advanced Technology Co., Ltd.

Response Rate

100.0%

Response Time

5.6hrs

  • Japan

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Semiconductor Inspection Equipment　Nidek Advanced Technology Co., Ltd.
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