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  4. Automotive component inspection equipment Power semiconductor module inspection equipment IGBT/SiC module inspection NATS-1000 (Nidek Advanced Technology Co., Ltd.)
Automotive component inspection equipment Power semiconductor module inspection equipment IGBT/SiC module inspection NATS-1000-NATS-1000
Automotive component inspection equipment Power semiconductor module inspection equipment IGBT/SiC module inspection NATS-1000-Nidek Advanced Technology Co., Ltd.

Automotive component inspection equipment Power semiconductor module inspection equipment IGBT/SiC module inspection NATS-1000
Nidek Advanced Technology Co., Ltd.

About This Product

■Automotive power semiconductor (IGBT, SiC) module insulation static characteristic dynamic characteristic testing equipment

The NATS-1000 is characterized by the fast inspection speed required for high and low temperature testing of automotive modules as well as in-line inspection, making it the world's fastest class of inspection equipment of its type. This product divides each test into four stations: room-temperature insulation, high-temperature static characteristics, high-temperature dynamic characteristics, and room-temperature static characteristics, and by distributing and parallelizing the tests, it ensures high-speed testing and contributes to improved productivity. I will. In addition, one unit can test 800,000 units per year in terms of 6in1*1 IGBT module, which not only provides excellent cost performance, but also allows for flexible response to expansion of testing capacity due to demand for automotive power semiconductors.

■Features

・Insulation inspection (ISO) ・Static characteristics inspection (DC) ・Dynamic characteristic test (AC) ・High temperature inspection ~175℃ (~200℃) ・High throughput up to 144UPH (25 seconds/unit) ・Low LS 4.5 nH ・Automatic line expansion possible ・IEC60747 compliant measurement ・AOI/warp inspection/laser marking universal jig ・Achieves low LS value and supports high precision inspection ・One-touch attachment/detachment jig mechanism

■High throughput

Achieves high throughput inspection of up to 144 UPH (25 seconds/unit)

■High temperature inspection

Compatible with high temperature inspection up to 200℃

  • Product

    Automotive component inspection equipment Power semiconductor module inspection equipment IGBT/SiC module inspection NATS-1000

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1 Models of Automotive component inspection equipment Power semiconductor module inspection equipment IGBT/SiC module inspection NATS-1000

Image Part Number Price (excluding tax)
Automotive component inspection equipment Power semiconductor module inspection equipment IGBT/SiC module inspection NATS-1000-Part Number-NATS-1000

NATS-1000

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Nidek Advanced Technology Co., Ltd.

  • Japan

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Semiconductor Inspection Equipment　Nidek Advanced Technology Co., Ltd.
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