Optical measurement device Optical heterodyne displacement meter
Photon Probe Co., Ltd.
About This Product
Features
■1nm resolution
0.001 micron is the vertical resolution. The measurement reference is the wavelength of a frequency-stabilized HeNe laser. Its wavelength is extremely stable.
■Records transient phenomena every 1μs at the shortest
Measures, records, and displays phenomena that change over a short period of time. Fluctuations can be seen at a glance on the PC's LCD screen.
■Up to 1 million points recorded and data processed
Recording time has been significantly increased. The huge number of recorded points can all be processed on a PC, and filter processing, Excel conversion, etc. can be performed.
■Relative measurement eliminates error factors based on base vibration, etc.
Two measurement points are set, and the relative value of displacement at those two points is measured. Only the relative fluctuation amount can be clarified and error factors such as base vibration components can be removed.
■Application
・Vibration analysis and response characteristic evaluation of PZT, damping steel plates, transformers, magnetic materials, etc. - Measuring responses and fluctuations of less than :m
・Measurement of Young's modulus of polymer materials, thin films, semiconductors, ceramics, etc. - Measuring responses to minute pressures and loads
・Evaluation of rotational dynamic characteristics of MD, FD, HD, optical discs, blanks, etc. - Evaluation of rotational speed dependence of waviness and distortion
・Surface wave and ultrasonic propagation velocity measurements on LN, alloys, steel materials, organic materials, etc. - For anisotropy and internal defect detection evaluation
・Analysis of vibration components in spatial fluctuations in laser exposure, sound waves in film materials, and ultrasonic waves - Analysis of fluctuation factors in the submicron world
・Evaluation of start-up dynamic characteristics of optical pickups and magnetic heads (sliders) - Measurement of various quantities depending on how the base is taken
・Dynamic thermal response characteristics of metals, polymers, and ceramics - Recording and thermal analysis of fluctuations in response to pulse heating
・Other physical quantities: Piezoelectric coefficient, thermal expansion coefficient, osmotic pressure, gravitational waves, physical strength, hardness, transient phenomena of shock waves are also measured.
・Surface roughness, flaw detection, deposited film thickness, and precision processing can also be measured in real time.
・Distance to the object to be measured can be approximately 2m for laser length measurement (however, to maintain resolution, the distance should be up to 50cm)
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Product
Optical measurement device Optical heterodyne displacement meter
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Handling Company
Photon Probe Co., Ltd.
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Categories
1 Models of Optical measurement device Optical heterodyne displacement meter
| Product Image | Part Number | Price (excluding tax) | External shape | Laser used | Measured quantity | Measurement mode | Measurement object reflectance | Measurement resolution | Measurement time | Metal protection tube | Number of output beams | Number of sampling points | Operating environment temperature | Optical frequency control | Output beam diameter | Output beam spread | Output light amount | Power consumption | Response frequency | Response speed | Sampling time | Warm up |
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HV400 |
Available upon quote | 430mm (W) x 460mm (D) x 230mm (H); Main body, weight 15kg | Frequency stabilized HeNe laser (FS1M) | Relative displacement (for 1 probe, 2 outputs, 2 probe type), absolute displacement (for 1 probe, 1 output type) | Real mode (real time measurement), storage mode (data recording at sampling time intervals) | 0.5% or more (conditions: distance between probe and object to be measured 20cm, mirror surface of object to be measured). Due to the focusing system, the measurable reflectance decreases as the distance decreases. | 1nm | Measurement time determined by the number of averaging processing points, sampling time, and number of sampling points = sampling time x number of sampling points x number of averaging processing points | Standard 2m (can be changed up to ~4m) | 1 (1 output type) 2 (2 output type) | Storage mode: Select from the following 8 types: 1000k points, 750k points, 500k points, 200k points, 100k points, 50k points, 30k points, 20k points, 10k points, 5k points, Real mode: Any number of points | 20±5℃ | Frequency shifter (FS1S) | Approximately 0.5mm at the exit | 1.5mrad or less | 100μW or more | AC100V・50/60Hz, 400W (main unit) | It depends on the sampling time. DC~1MHz | It depends on the sampling time. 0~310mm/s | 1μs (Storage mode) Select from 50ms, 100ms, 200ms, 500ms, 1s (Real mode) | 45 minutes |
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About Company Handling This Product
- Japan