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Optical measurement device Optical heterodyne displacement meter-HV400
Optical measurement device Optical heterodyne displacement meter-Photon Probe Co., Ltd.

Optical measurement device Optical heterodyne displacement meter
Photon Probe Co., Ltd.


About This Product

Features

■1nm resolution

0.001 micron is the vertical resolution. The measurement reference is the wavelength of a frequency-stabilized HeNe laser. Its wavelength is extremely stable.

■Records transient phenomena every 1μs at the shortest

Measures, records, and displays phenomena that change over a short period of time. Fluctuations can be seen at a glance on the PC's LCD screen.

■Up to 1 million points recorded and data processed

Recording time has been significantly increased. The huge number of recorded points can all be processed on a PC, and filter processing, Excel conversion, etc. can be performed.

■Relative measurement eliminates error factors based on base vibration, etc.

Two measurement points are set, and the relative value of displacement at those two points is measured. Only the relative fluctuation amount can be clarified and error factors such as base vibration components can be removed.

■Application

・Vibration analysis and response characteristic evaluation of PZT, damping steel plates, transformers, magnetic materials, etc. - Measuring responses and fluctuations of less than :m ・Measurement of Young's modulus of polymer materials, thin films, semiconductors, ceramics, etc. - Measuring responses to minute pressures and loads ・Evaluation of rotational dynamic characteristics of MD, FD, HD, optical discs, blanks, etc. - Evaluation of rotational speed dependence of waviness and distortion ・Surface wave and ultrasonic propagation velocity measurements on LN, alloys, steel materials, organic materials, etc. - For anisotropy and internal defect detection evaluation ・Analysis of vibration components in spatial fluctuations in laser exposure, sound waves in film materials, and ultrasonic waves - Analysis of fluctuation factors in the submicron world ・Evaluation of start-up dynamic characteristics of optical pickups and magnetic heads (sliders) - Measurement of various quantities depending on how the base is taken ・Dynamic thermal response characteristics of metals, polymers, and ceramics - Recording and thermal analysis of fluctuations in response to pulse heating ・Other physical quantities: Piezoelectric coefficient, thermal expansion coefficient, osmotic pressure, gravitational waves, physical strength, hardness, transient phenomena of shock waves are also measured. ・Surface roughness, flaw detection, deposited film thickness, and precision processing can also be measured in real time. ・Distance to the object to be measured can be approximately 2m for laser length measurement (however, to maintain resolution, the distance should be up to 50cm)

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    Optical measurement device Optical heterodyne displacement meter

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1 Models of Optical measurement device Optical heterodyne displacement meter

Image Part Number Price (excluding tax) Metal protection tube Measurement time Measured quantity Measurement object reflectance Measurement resolution Measurement mode Power consumption Response speed Response frequency External shape Output light amount Number of output beams Output beam spread Output beam diameter Optical frequency control Operating environment temperature Laser used Number of sampling points Sampling time Warm up
Optical measurement device Optical heterodyne displacement meter-Part Number-HV400

HV400

Available upon quote

Standard 2m (can be changed up to ~4m)

Measurement time determined by the number of averaging processing points, sampling time, and number of sampling points = sampling time x number of sampling points x number of averaging processing points

Relative displacement (for 1 probe, 2 outputs, 2 probe type), absolute displacement (for 1 probe, 1 output type)

0.5% or more (conditions: distance between probe and object to be measured 20cm, mirror surface of object to be measured). Due to the focusing system, the measurable reflectance decreases as the distance decreases.

1nm

Real mode (real time measurement), storage mode (data recording at sampling time intervals)

AC100V・50/60Hz, 400W (main unit)

It depends on the sampling time. 0~310mm/s

It depends on the sampling time. DC~1MHz

430mm (W) x 460mm (D) x 230mm (H); Main body, weight 15kg

100μW or more

1 (1 output type) 2 (2 output type)

1.5mrad or less

Approximately 0.5mm at the exit

Frequency shifter (FS1S)

20±5℃

Frequency stabilized HeNe laser (FS1M)

Storage mode: Select from the following 8 types: 1000k points, 750k points, 500k points, 200k points, 100k points, 50k points, 30k points, 20k points, 10k points, 5k points, Real mode: Any number of points

1μs (Storage mode) Select from 50ms, 100ms, 200ms, 500ms, 1s (Real mode)

45 minutes

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