This product is registered by Optoscience Co., Ltd..
About This Product
This is a microscope type imaging ellipsometer. It is possible to measure the refractive index (n and k) and thin film thickness at every point in the image within a much smaller area than a regular ellipsometer.
■Summary
This system measures the ellipsometry image (Ψ, ⊿) of the acquired sample in about 4 seconds, and can measure the refractive index and thickness of thin films in minute areas. The onboard optical unit allows you to measure samples in the wavelength range from 250nm to 1,000nm.
EllipsoStep allows you to quickly and directly measure the ellipsometry (ellipsometric properties) of your sample pixel by pixel, as well as with a lateral resolution of less than 1 µm. By displaying real-time microscopic images of samples and using them in combination with advanced analysis capabilities, properties such as thin film thickness and refractive index can be measured with high resolution.
application
■Semiconductor related
In the semiconductor industry, ellipsometry is an industry standard instrument. Imaging ellipsometers capable of micro-imaging can measure samples with higher precision, allowing for even greater product development than ever before.
■LCD/OLED display
Both LCD and OLED displays use thin film technology. It can be applied to new product development and manufacturing processes.
■Polymer
Polymer films are widely used in thin film structures in the display industry and can be characterized using EllipsoStep.
■Solar cells
Alternative energy is a huge emerging market and ellipsometry is an important tool in the development of next generation solar cells.
■Graphene
Interest in the development of new materials and new technologies, such as 2D materials like graphene, is very high. Imaging ellipsometry is a very important instrument for establishing new processes.
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