Thin film measurement system MTFW-50
Miwa Opto Co., Ltd.
About This Product
It can be installed as an option on Gartna's ellipsometer, expanding the range of film thickness measurements. It can also be installed in existing systems. It is possible to upgrade the system by itself.
■Features
・High-speed measurement possible
・Easy to set up
・Fusion of ellipsometer
・Reflectance measurement possible
・Easy to measure
・Compact design
・Excellent stability
・Can be installed alone
・Easy and simple analysis
・Windows OS
・Low price
・Program selection by menu
・Thick films can also be measured (up to 1 mm on glass, also possible on Si)
・Multi-point measurement is also possible
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Product
Thin film measurement system MTFW-50
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Handling Company
Miwa Opto Co., Ltd.
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Categories
1 Models of Thin film measurement system MTFW-50
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
|
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MTFW-50 |
Available upon quote |
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About Company Handling This Product
- Japan