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  4. Thin film measurement system MTFW-50 (Miwa Opto Co., Ltd.)
Thin film measurement system MTFW-50-MTFW-50
Thin film measurement system MTFW-50-Miwa Opto Co., Ltd.

Thin film measurement system MTFW-50
Miwa Opto Co., Ltd.

About This Product

It can be installed as an option on Gartna's ellipsometer, expanding the range of film thickness measurements. It can also be installed in existing systems. It is possible to upgrade the system by itself.

■Features

・High-speed measurement possible ・Easy to set up ・Fusion of ellipsometer ・Reflectance measurement possible ・Easy to measure ・Compact design ・Excellent stability ・Can be installed alone ・Easy and simple analysis ・Windows OS ・Low price ・Program selection by menu ・Thick films can also be measured (up to 1 mm on glass, also possible on Si) ・Multi-point measurement is also possible

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    Thin film measurement system MTFW-50

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1 Models of Thin film measurement system MTFW-50

Image Part Number Price (excluding tax)
Thin film measurement system MTFW-50-Part Number-MTFW-50

MTFW-50

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About Company Handling This Product

Miwa Opto Co., Ltd.

  • Japan

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Thickness Gages
Thickness Gages　Miwa Opto Co., Ltd.
Miwa Opto Co., Ltd.

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