Film thickness meter optical interference type EL2
Miwa Opto Co., Ltd.
About This Product
■Summary
EL2 is a device that can measure DLC (diamond-like carbon) film thickness with high precision and without contact using an optical method. DLC film thickness can be measured in seconds by simply placing the sample on the stage.
■Features
・DLC compatible film thickness meter.
・Measurement on flat and curved surfaces is possible.
・Customization is also possible.
・It is also introduced on the website of the Kinki Bureau of Economy, Trade and Industry.
■Main specifications
・Sample shape: The film thickness can be measured not only on flat surfaces but also on cylindrical and spherical surfaces.
・Sample size: 1 mm square (flat), 1 mm diameter (cylindrical, sphere) or more.
- Substrate materials: metal (iron, aluminum, SUS, etc.), silicon, glass, plastic, rubber, etc.
・Measurable film thickness: 0.5 to 30 microns (option that can measure up to 0.2 microns is also available).
・Measurement accuracy: ±5%
・Applicable to large samples such as Si carriers (optional).
- Can also be applied to DLC film coated on the inner surface of a cylinder.
-Refractive index can also be measured (optional).
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Product
Film thickness meter optical interference type EL2
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Handling Company
Miwa Opto Co., Ltd.
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Categories
1 Models of Film thickness meter optical interference type EL2
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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EL2 |
Available upon quote |
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About Company Handling This Product
- Japan