Optical interference film thickness meter HE3224-HE3224

Optical interference film thickness meter HE3224
Toyoshin Electronics Co., Ltd.

About This Product

Transparent thin films such as silicon wafers are measured with high precision using light interference.

■Contents・1 measuring head
・1 measurement unit
・1 spectrometer
・1 optical fiber between spectrometer and head
・1 USB cable (1m)
・Control software (Windows 7 or higher) *Control PC is not included with this product

■Options・Light source (tungsten halogen 20W or more)
・Optical fiber between light source and head (1m)

Model
There are 1 models for this product.

Product
Optical interference film thickness meter HE3224

Handling Company
Toyoshin Electronics Co., Ltd.

Categories

Meters & Instruments

Film Thickness Meters

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1 Models of Optical interference film thickness meter HE3224

Image	Part Number	Price (excluding tax)	Error	Accuracy	Measuring range	Measurement method	Number of measurement layers	Product name	Reference value	Power supply used
	HE3224	Available upon quote	0.5nm	1nm	100nm~2,000nm	Visible spectroscopy	Single layer	Optical interference film thickness meter	494.14nm (494.19nm sample measurement) ,82.21nm (82.24nm sample measurement)	5V (USB)

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